<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>Q</mml:mi></mml:math>Structure and<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-Shell Vacancies in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msup><mml:mrow><mml:mi mathvariant="normal">Ne</mml:mi></mml:mrow><mml:mrow><mml:mo>+</mml:mo></mml:mrow></mml:msup></mml:mrow></mml:math>-Ne Collisions at 150 to 400 keV

Kessel, Q. C.; McCaughey, Michael P.; Everhart, E.

doi:10.1103/physrevlett.16.1189

Cited by 33 publications

(2 citation statements)

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“…The values for the neutral neon atom using the adiabatic model (column B) agree equally well with results derived from the work of Bagus (1965). The experimental value for the binding energy of the Is electron in the neutral atom is 870 eV (Korber and Mehlhorn 1966). This value is in good agreement with the estimate obtained using an adiabatic model.…”

Section: Electron Binding Energiessupporting

confidence: 88%

SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

Fillard

Manifacier

1970

Jpn. J. Appl. Phys.

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The electron binding energies for the various sub-shells of the neon atom and its ions have been calculated using a non-relativistic Hartree-Fock self-consistent field procedure. The dependence of the energy of the emitted x-ray photon or Auger electron when a K-shell vacancy is filled on the degree of ionization in the valence shell of the atom has been investigated. Both single and double hole states have been considered.

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Section: Electron Binding Energiessupporting

confidence: 88%

SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

Fillard

Manifacier

1970

Jpn. J. Appl. Phys.

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“…In the second half on the sixties similar other measurements were also published: e.g. Kessel et al, 1966;Kessel et al, 1967;McCaughey et a I ., 1968. In the seventies the research work in this field was broadened very much. The experimental techniques were improved in several respects.…”

Section: Short History Of the Stud I Es On I On-i Nd Uced Auger Elmentioning

confidence: 77%

Ion-Induced Auger Electron Processes in Gases

Berényi

1988

X-Ray Spectroscopy in Atomic and Solid State Physics

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Excitation in Energetic Ion-Atom Collisions Accompanied by Electron Emission

Stolterfoht¹

1978

Topics in Current Physics

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With 28 FiguresWhen a fast charged particle is incident on an atom or a molecule, generally one or more electrons are ejected in the collision. The production of electrons by ion impact is of principal interest in many branches of physics and related sciences. Thus, electron spectroscopy in ion-atom collisions has received a great deal of attention in the past. Atomic structures as well as dynamic excitation mechanisms have been studied by electron detection. These efforts have revealed important information about the electron production mechanisms in collisions between ions and atoms.The purpose of the present chapter is to review recent studies of inner-and outer-shell excitation in ion-atom collisions accompanied by electron emission. Emphasis is given to the excitation mechanisms rather than to the atomic structure aspects. Projectile energies in the keV range as well as in the MeV range will be treated. The amount of work done in this field is tremendous so that no attempt is made to give a complete summary here. For instance, the present chapter will be restricted to projectile energies higher than about 5 keV, and electron measurements using the beam-foil method are not included. Also, instrumental details will not be given; the discussion of the apparatus is left to the original references. In this chapter, specific topics are selected which are instructive for the understanding of electron excitation mechanisms in ion-atom collisions.For reasons of convenient representation, this chapter is structured to describe excitation of outer-shells and inner-shells separately. This choice is somewhat arbitrary, as the related excitation mechanisms are rather similar in the two cases. However, differences occur in the experimental methods for studying outer-and inner--shell excitation by electron spectroscopy. Generally, in the latter case, Auger electrons of well-defined energies are detected, whereas in the first case continuous electron spectra are measured.Following the background Section 5.1, a brief survey about electron production mechanisms is given in Section 5.2. Then, more detailed aspects of the field will be discussed. Section 5.3 is devoted to outer-shell ionization of the projectile and the target atom. In Section 5.4 the inner-shell excitation of the collision particles is treated. A few examples of Auger spectra will be given and, then, inner vacancy production mechanisms will be discussed within the framework of excitation models, such as direct excitation and electron promotion. Literature till spring 1976 is taken into consideration. I. A. Sellin (ed.), Structure and Collisions of Ions and Atoms

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QStructure andK-Shell Vacancies inNe+-Ne Collisions at 150 to 400 keV

Abstract: Coincidence measurements of large-angle collisions have been made for the reaction 4.ffl+ W+

Cited by 33 publications

References 11 publications

SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

Ion-Induced Auger Electron Processes in Gases

Excitation in Energetic Ion-Atom Collisions Accompanied by Electron Emission

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QStructure andK-Shell Vacancies inNe+-Ne Collisions at 150 to 400 keV

Abstract: Coincidence measurements of large-angle collisions have been made for the reaction 4.ffl+ W+

Cited by 33 publications

References 11 publications

SnO2-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

SnO2-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

Ion-Induced Auger Electron Processes in Gases

Excitation in Energetic Ion-Atom Collisions Accompanied by Electron Emission

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SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure

SnO₂-Semi-Conductor Heterojunction. Electrical Properties of a Particular MOS Structure