Subpicosecond photoinduced Stark spectroscopy experiments are carried out for measuring charge carrier mobility in organic semiconductors. The technique is demonstrated in state-of-art devices based on methanofullerene. The transient mobility of photogenerated charge carriers is measured in the picosecond time domain. Electric field dependent mobility is observed from the earliest time scales. In addition, two distinct transport regimes are revealed: a short-lived state, approximately 10 ps, of high mobility and a transient towards the trap limited transport, associated with the mesoscopic structure of the medium. DOI: 10.1103/PhysRevLett.96.106601 PACS numbers: 72.80.Rj, 72.80.Ng, 78.47.+p, 78.66.Tr Charge carrier mobility in organic semiconductors is a critical material property that determines the performance characteristics of many electronic devices, including fieldeffect transistors [1], light-emitting diodes [2], and solar cells [3]. For this reason, many experimental techniques and theoretical modeling have been devoted to its measure and interpretation [4 -7]. It turns out that different experiments provide different values of carrier mobility in the same material, due to varying experimental conditions and different device architectures. For instance, it is found that the hole mobility of common polymer semiconductors is several orders of magnitude lower when tested in lightemitting diodes than in field-effect transistors [8,9]. Such variations make material evaluation difficult if not impossible.In amorphous organic materials charge carrier mobility is often the average of a number of slowing down processes where defects and traps dominate. Ideally one would like to measure the carrier mobility in a pure, defect free material, so meaningful comparison between different experiments and theory would be allowed. Close to this ideal case is the use of time resolved microwave conductivity technique, an electrodeless method that monitors charge dipoles absorption in the transient regime [7,10]. The time resolution of this technique is limited, however, to the nanosecond domain. Here we present an alternative approach, based on photoinduced transient Stark effect in which optical probing is exploited for extracting mobility values in the picosecond time regime. A related technique, exploiting the Franz-Keldysh effect in extended band states, was successfully employed by Shank et al. to measure nonequilibrium carrier transport in inorganic semiconductors [11][12][13]. The validity of our method relies on the fact that charge transport is monitored in situ on the compound without current extraction, avoiding pitfalls caused by carrier migration along macroscopic regions of the sample as well as by carrier extraction at semiconductor-metal electrode interfaces. Mobilities obtained in this way can be considered as upper limit values, unaffected by limiting processes such as trapping or recombination. This information is intrinsic and constitutes a direct feedback for the design of new materials with improved...