2021
DOI: 10.1016/j.ndteint.2021.102418
|View full text |Cite
|
Sign up to set email alerts
|

Mode excitability and selectivity for enhancing scanning guided wave-based characterization of subwavelength defect

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 44 publications
0
1
0
Order By: Relevance
“…And frequency points in the frequency-wavenumber spectra with wavenumber being zero are called cutoff frequency points 1,2 . Local resonances formed by zero-group velocity and cutoff frequency points will show sharp resonance peaks in the frequency spectrum, which can be utilized for non-destructive evaluation (NDE) applications, including damage detection 3,4 and material characterization 5,6 . The existence and application of those local resonances have been extensively reported in plate and pipe structures 2,7 .…”
Section: Introductionmentioning
confidence: 99%
“…And frequency points in the frequency-wavenumber spectra with wavenumber being zero are called cutoff frequency points 1,2 . Local resonances formed by zero-group velocity and cutoff frequency points will show sharp resonance peaks in the frequency spectrum, which can be utilized for non-destructive evaluation (NDE) applications, including damage detection 3,4 and material characterization 5,6 . The existence and application of those local resonances have been extensively reported in plate and pipe structures 2,7 .…”
Section: Introductionmentioning
confidence: 99%