2014
DOI: 10.1109/ted.2014.2299549
|View full text |Cite
|
Sign up to set email alerts
|

Model and Characterization of ${\rm VO}_{2}$ Thin-Film Switching Devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
6
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 16 publications
(6 citation statements)
references
References 16 publications
0
6
0
Order By: Relevance
“…Investigations of few-micron-sized thin film VO 2 two terminal devices have widely reported that the observed steep decrease of resistance at a critical current or voltage is related to a field-induced metal-insulator transition, [126][127][128][129][130][131][132][133]. However, recent work, [134][135][136][137][138][139][140][141], has found the switching to be induced by Joule heating rather than directly by the applied electric field.…”
Section: Switching Of Vo 2 2-terminal Devicesmentioning
confidence: 99%
“…Investigations of few-micron-sized thin film VO 2 two terminal devices have widely reported that the observed steep decrease of resistance at a critical current or voltage is related to a field-induced metal-insulator transition, [126][127][128][129][130][131][132][133]. However, recent work, [134][135][136][137][138][139][140][141], has found the switching to be induced by Joule heating rather than directly by the applied electric field.…”
Section: Switching Of Vo 2 2-terminal Devicesmentioning
confidence: 99%
“…However, when the dissipated power in this current reaches a sufficient level to locally raise the temperature above the point of phase transition, the switch body develops metallic regions, which then rapidly develop into a thin filament of metallic VO 2 between the switch contacts, latching the device in the on state. This behavior was first investigated by Zhao et al 6 , and later examined by Jordan et al 7 . The onset of latching is dependent on the electric field, and so switches with smaller gaps between contacts latch at lower powers compared to those with larger gaps.…”
Section: High Power Latchingmentioning
confidence: 90%
“…The behavior of the reflection is due to a change in the conditions for the interference of the reflected waves during MIT. Also in many articles [31][32][33][34][35][36] of an applied nature, an experimental and theoretical study of the microwave properties of VO 2 with MIT is carried out. So scattering parameters, including reflection, attenuation as a function of frequency and temperature, the dependence of these quantities on the phase state of VO 2 was established [32][33][34][35][36].…”
Section: Figmentioning
confidence: 99%