2014
DOI: 10.1109/ted.2014.2340900
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Modeling of Drain Electric Flux Passing Through the BOX Layer in SoI MOSFETs—Part II: Model Derivation and Validity Confirmation

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Cited by 2 publications
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“…In Part I, as preparation for model development, the relationships between coordinates in MOSFETs and potential/stream function were derived using conformal mapping, and related validity was verified. In Part II [40], the model's development was considered based on these relationships, and its validity was also verified.…”
mentioning
confidence: 99%
“…In Part I, as preparation for model development, the relationships between coordinates in MOSFETs and potential/stream function were derived using conformal mapping, and related validity was verified. In Part II [40], the model's development was considered based on these relationships, and its validity was also verified.…”
mentioning
confidence: 99%