“…Accordingly, this paper focuses on the characterization of C iss (V gs ), C gs (V gs ) and C gd (V gs ) in the range of (V gs,off , V gs,on ), where V gs,off and V gs,on are the maximum recommended turn-off and turn-on gate-source control voltages. This is of high importance for emerging SiC power MOSFETs with respect to: i) designing the gate circuit [12], [19], ii) evaluating gate bias instability [20], iii) extracting electrically active traps and defects at the MOS interface [21]- [23], and iv) parametrization of compact device models by including V gs dependent capacitance models as suggested in [4], [5], [14], [15], [24].…”