2010 IEEE Energy Conversion Congress and Exposition 2010
DOI: 10.1109/ecce.2010.5618009
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Modeling the inter-electrode capacitances of Si CoolMOS transistors for circuit simulation of high efficiency power systems

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Cited by 9 publications
(5 citation statements)
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“…In other words, while the electrical device is physics-based, the temperature dependence of those parameters are behavioral. A physics-based model for a CoolMOS MOSFET is developed from the Hefner model in [13] since the internal Hefner IGBT model contains an equivalent internal MOSFET.…”
Section: Electro-thermal Model -Electricalmentioning
confidence: 99%
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“…In other words, while the electrical device is physics-based, the temperature dependence of those parameters are behavioral. A physics-based model for a CoolMOS MOSFET is developed from the Hefner model in [13] since the internal Hefner IGBT model contains an equivalent internal MOSFET.…”
Section: Electro-thermal Model -Electricalmentioning
confidence: 99%
“…3 developed to model the inter-electrode capacitances of CoolMOS in [57]. Due to the complexity of the numerical model described for the nonlinear capacitance in [57], the model implemented in SABER has been simplified and linearized using Taylor series.…”
Section: Power Mosfetmentioning
confidence: 99%
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“…Accordingly, this paper focuses on the characterization of C iss (V gs ), C gs (V gs ) and C gd (V gs ) in the range of (V gs,off , V gs,on ), where V gs,off and V gs,on are the maximum recommended turn-off and turn-on gate-source control voltages. This is of high importance for emerging SiC power MOSFETs with respect to: i) designing the gate circuit [12], [19], ii) evaluating gate bias instability [20], iii) extracting electrically active traps and defects at the MOS interface [21]- [23], and iv) parametrization of compact device models by including V gs dependent capacitance models as suggested in [4], [5], [14], [15], [24].…”
Section: Introductionmentioning
confidence: 99%