The Nanopositioning and Nanomeasuring Machine NMM-1 was designed for measurements within a measuring volume of 25 mm by 25 mm by 5 mm. The interferometric length measuring and drive systems make it possible to move the stage and corner mirror with a resolution of 0.1 nm in all three axes. The object being measured is placed on the corner mirror and can be measured with different probe systems. The very high precision of the machine can be attributed to several factors, the accuracy of the interferometric measuring systems, the three-dimensional realization of the Abbe comparator principle, the precise reference coordinate system defined by the corner mirror and the additional compensation of angular deviations. This article describes a small part of the measurement uncertainty analysis for a displacement measurement using two positions of the measuring mirror. In particular this article discusses the influence of offset, amplitude and phase deviations in the interference signals.