“…On the one hand, the application of the laser rastering technique integrated in PLD can achieve films which have a homogeneous thickness over the whole substrate. 16,29,30 On the other hand, we systematically study the surface morphologies, crystalline qualities, and interfacial properties of the as-grown GaN films by white-light interferometry, in situ RHEED, scanning electron microscopy (SEM), atomic force microscopy (AFM), polarized light microscopy, high-resolution X-ray diffraction (HRXRD), and high-resolution transmission electron microscopy (HRTEM). This will be beneficial to researchers who want to understand the growth of GaN films on Cu substrates comprehensively.…”