2009 34th IEEE Photovoltaic Specialists Conference (PVSC) 2009
DOI: 10.1109/pvsc.2009.5411707
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Modelling the effects of distributed series resistance on Suns-V<inf>oc</inf>, m-V<inf>oc</inf> and J<inf>sc</inf>-Suns curves of solar cells

Abstract: A simple model based on the simulation of distributed series resistance effects in solar cells is presented. This model overcomes limitations of the standard two-diode model representation of solar cells in respect to fitting Suns-Voc (m-Voc) and Jsc-Suns curves. The model results include (i) an improved understanding of two-dimensional current flows in shunted solar cells, (ii) the prediction of shunt types from m-Voc curves and corresponding distributed resistance model fits, (iii) the insight that lateral c… Show more

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Cited by 7 publications
(3 citation statements)
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“…While awareness of varying bulk lifetime with injection level is common, an empirically measured ILD lifetime is rarely utilized. Other mechanisms, such as a distributed series resistance , have been described or employed in order to fit a one or two‐diode model to real cell responses.…”
Section: Boundary + Injection‐level‐dependent Lifetime Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…While awareness of varying bulk lifetime with injection level is common, an empirically measured ILD lifetime is rarely utilized. Other mechanisms, such as a distributed series resistance , have been described or employed in order to fit a one or two‐diode model to real cell responses.…”
Section: Boundary + Injection‐level‐dependent Lifetime Modelmentioning
confidence: 99%
“…However, as others have pointed out, the magnitude of recombination in the SCR for a non‐defective, high efficiency cell is negligible and therefore cannot account for the observed J 02 . Other suspects for the source of the J 02 component have been edge recombination and distributed series resistance .…”
Section: Boundary + Injection‐level‐dependent Lifetime Modelmentioning
confidence: 99%
“…Generally, the n=2 diode (V1>V2) accounts for recombination in the junction space charge region and at grain boundaries, whereas the n=1 diode (V1<V2) accounts for bulk and surface recombination. Detailed explanation on Suns V oc measurement is described in elsewhere [7]. One Suns V oc of 502.4±3.7 mV was resulted from different positions of identically treated films.…”
Section: B Emitter Formationmentioning
confidence: 99%