Modern electrometer techniques

Barker, R.W.J.

doi:10.1049/piee.1979.0190

Cited by 7 publications

(6 citation statements)

References 21 publications

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“…Current designs of operational amplifier do not have the necessary gainbandwidth product coupled with ultralow input noise characteristics required for this application. A single operational amplifier is therefore replaced by a discrete JFET input stage followed by a wide bandwidth video amplifier within the feedback loop of the current to voltage converter (for a discussion of electrometer amplifier design considerations see Barker, 1979). Other specimen current amplifiers have been reported in the literature including a low-noise design described by Maussion (1985) which was based on an operational amplifier.…”

Section: The Detection Circuit and The Amplijiermentioning

confidence: 99%

High‐pressure scanning electron microscopy of insulating materials: A new approach

Farley¹,

Shah²

1991

Journal of Microscopy

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SUMMARY A new SEM technique for imaging uncoated non‐conducting specimens at high beam voltages is described which employs a high‐pressure environment and an electric field to achieve charge neutralization. During imaging, the specimen surface is kept at a stable low voltage, near earth potential, by directing a flow of positive gas ions at the specimen surface under the action of an electric bias field at a pressure of about 200 Pa. In this way charge neutrality is continuously maintained to obtain micrographs free of charging artefacts. Images are formed by specimen current detection containing both secondary electron and backscattered electron signal information. Micrographs of geological, ceramic, and semiconductor materials obtained with this method are presented. The technique is also useful for the SEM examination of histological sections of biological specimens without any further preparation. A simple theory for the charge neutralization process is described. It is based on the interaction of the primary and emissive signal components with the surrounding gas medium and the resulting neutralizing currents. Further micrographs are presented to illustrate the pressure dependence of the charge neutralization process in two glass specimens which show clearly identifiable charging artefacts in conventional microscopy.

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Section: The Detection Circuit and The Amplijiermentioning

confidence: 99%

High‐pressure scanning electron microscopy of insulating materials: A new approach

Farley¹,

Shah²

1991

Journal of Microscopy

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“…The influences of temperature on electrometer have been aware for a long time [ 22 ]. It is commonly accepted that the performance of the aerosol electrometer were highly determined by the characteristics of electrometer [ 23 ].…”

Section: Resultsmentioning

confidence: 99%

Design and Evaluation of an Aerosol Electrometer with Low Noise and a Wide Dynamic Range

Yang

Zhang

et al. 2018

Sensors

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A low-noise aerosol electrometer with a wide dynamic range has been designed for measuring the total net charge on high concentration aerosol particles within the range of −500 pA to +500 pA. The performance of the aerosol electrometer was evaluated by a series of experiments to determine linearity, sensitivity and noise. The relative errors were controlled within 5.0%, 1.0% and 0.3% at the range of −40 pA to +40 pA, ±40 pA to ±100 pA, and ±100 pA to ±500 pA respectively. The stability of the designed aerosol electrometer was found to be highly sensitive to temperature variations, but under temperature control, the root mean square noise and the peak-to-peak noise were 1.040 fA and 5.2 fA respectively, which are very close to the calculated theoretical limit of the current noise. The excellent correlation and the advantage of a wide dynamic range have been demonstrated by comparing with the designed aerosol electrometer to a commercial aerosol electrometer. A 99.7% (R2) statistical correlation was obtained; meanwhile, the designed aerosol electrometer operated well even when an overrange phenomenon appeared in the commercial aerosol electrometer.

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“…According to the equation (2), there are a few strategies to obtain lower phase noise in the MEMS resonator based self-sustaining oscillator, for example, higher Q factor, lower resonance frequency, higher carrier output power and lower temperature. In addition, by reducing flicker noise up-conversion and white noise (total root sum square of uncorrelated shot noise and Johnson noise) of the electronic circuitries, better phase noise performance can be achieved.…”

Section: Mems Based Resonant Electrometermentioning

confidence: 99%

“…Contacting (direct) and non-contacting (no physical or electrical contact) measurements are two different methods that are used to detect electrostatic charge. Charge sensors or charge electrometers are widely used for direct measurement of electric charge or extremely small current [1,2]. On the other hand, a number of non-contacting electrostatic voltmeters and electric field meters have been used for many years to measure the surface charge of any test object [3][4][5][6][7][8].…”

Section: Introductionmentioning

confidence: 99%

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Sensing of single electrons using micro and nano technologies: a review

et al. 2017

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During the last three decades, the remarkable dynamic features of microelectromechanical systems (MEMS) and nanoelectromechanical systems (NEMS), and advances in solid-state electronics hold much potential for the fabrication of extremely sensitive charge sensors. These sensors have a broad range of applications, such as those involving the measurement of ionization radiation, detection of bio-analyte and aerosol particles, mass spectrometry, scanning tunneling microscopy, and quantum computation. Designing charge sensors (also known as charge electrometers) for electrometry is deemed significant because of the sensitivity and resolution issues in the range of micro- and nano-scales. This article reviews the development of state-of-the-art micro- and nano-charge sensors, and discusses their technological challenges for practical implementation.

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Modern electrometer techniques

Cited by 7 publications

References 21 publications

High‐pressure scanning electron microscopy of insulating materials: A new approach

High‐pressure scanning electron microscopy of insulating materials: A new approach

Design and Evaluation of an Aerosol Electrometer with Low Noise and a Wide Dynamic Range

Sensing of single electrons using micro and nano technologies: a review

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