1994
DOI: 10.1063/1.357016
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Modification of surface band bending of diamond by low energy argon and carbon ion bombardment

Abstract: Argon and carbon ion bombardment of p-diamond at 500–5000 eV in ultrahigh vacuum were studied by in situ x-ray photoelectron spectroscopy (XPS) and low energy electron diffraction analysis. Both argon and carbon ion bombardment at room temperature in the present energy range created a defective surface layer. The radiation damage was manifested by the introduction of a distinct C 1s peak (referred to as the ‘‘defect’’ peak later) with a binding energy about 1 eV less than that of the bulklike diamond peak, and… Show more

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Cited by 101 publications
(26 citation statements)
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“…Such broadening is characteristic when diamond transforms to disordered carbon. 14,27 The binding energy position of the C͑1s) line as determined by XPS and PEY NEXAFS are somewhat different. Although in both cases an upward shift in binding energy for the implanted diamond films was observed.…”
Section: Resultsmentioning
confidence: 99%
“…Such broadening is characteristic when diamond transforms to disordered carbon. 14,27 The binding energy position of the C͑1s) line as determined by XPS and PEY NEXAFS are somewhat different. Although in both cases an upward shift in binding energy for the implanted diamond films was observed.…”
Section: Resultsmentioning
confidence: 99%
“…In the literature, the presence of an additional C1s component at a low binding energy has been reported for polymer surfaces bombarded with ions,31 and this new contribution is assigned to amorphous carbon resulting from the surface degradation. In this work, the degradation of the polymer surface covered with nickel has been demonstrated from the loss of oxygenated products, which induces variations in the O/C ratios (Fig.…”
Section: Discussionmentioning
confidence: 99%
“…3 shows the XPS spectrum of the AECF-V carbon sample. A strong peak centered at 285 eV and a weaker peak at 1224 eV were assigned to C1s and CKL1, respectively [16]. The content ratio of carbon in AECF-V sample was about 91%.…”
Section: Electrochemical Measurement Of Carbon Samplesmentioning
confidence: 99%