2007
DOI: 10.1016/j.apsusc.2007.03.024
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Modification of the electronic properties of the TiO2 (110) surface upon deposition of the ultrathin conjugated organic layers

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Cited by 26 publications
(32 citation statements)
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“…The ionization potential of the F 16 -CuPc films was determined as about 6 eV, which is approximately 1.1 eV higher than the ionization potential of the unsubstituted CuPc. There has been shown that CuPc molecules act as electron donors relatively to the silicon, titanium and zinc oxide surfaces [21] while electron acceptor behavior is expected from F 16 -CuPc [6,20]. In this paper the authors present the TCS results on the band alignment and on DOUS at the interface of the CuPc and F 16 -CuPc ultra-thin layers.…”
Section: Introductionmentioning
confidence: 94%
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“…The ionization potential of the F 16 -CuPc films was determined as about 6 eV, which is approximately 1.1 eV higher than the ionization potential of the unsubstituted CuPc. There has been shown that CuPc molecules act as electron donors relatively to the silicon, titanium and zinc oxide surfaces [21] while electron acceptor behavior is expected from F 16 -CuPc [6,20]. In this paper the authors present the TCS results on the band alignment and on DOUS at the interface of the CuPc and F 16 -CuPc ultra-thin layers.…”
Section: Introductionmentioning
confidence: 94%
“…The thickness of the overlayer deposited was controlled using a quartz microbalance as well as using the analysis of the attenuation of the TCS signal from the underlayer [16,[21][22][23]. The LEED unit installed was used as a main instrumentation for the measurements according to the TCS method described in detail in [17][18][19].…”
Section: Methodsmentioning
confidence: 99%
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