2019
DOI: 10.1142/s2010324719500061
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MOKE Magnetometer Studies of Evaporated Ni and Ni/Cu Thin Films onto Different Substrates

Abstract: The Magneto-Optic Kerr Effect (MOKE) technique has been used to investigate the magnetic properties of Ni thin films, with thickness [Formula: see text] ranging from 9 to 163[Formula: see text]nm, evaporated onto several substrates (glass, Si (111), mica and Cu) with and without an evaporated Cu underlayer. The MOKE observations were correlated with the surface morphology inferred from Scanning Electron Microscope images and with the structural properties (grain size and strain). Some interesting behaviors of … Show more

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Cited by 8 publications
(3 citation statements)
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References 42 publications
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“…A. Sharma et al [16] and L. Kerkache [10] et.al found a value of S equal to 0.82 and 0.91 for Ni (40 nm)/Si; and Ni (42 nm), which matches well with our results for Ni/Si (10 nm and 20 nm) films. These values are slightly different for curved films.…”
Section: Magnetic Measurementssupporting
confidence: 91%
See 1 more Smart Citation
“…A. Sharma et al [16] and L. Kerkache [10] et.al found a value of S equal to 0.82 and 0.91 for Ni (40 nm)/Si; and Ni (42 nm), which matches well with our results for Ni/Si (10 nm and 20 nm) films. These values are slightly different for curved films.…”
Section: Magnetic Measurementssupporting
confidence: 91%
“…L. Kerkache et al also studied the thickness and substrate materials dependent magnetic properties of Ni thin films deposited onto various substrates (glass, Si single crystal, mica and Cu), in which thicknessdependent stress induced anisotropy was observed [10]. In the present work, we have prepared curved surface on plain standard substrate and study the magnetic and structural properties of Ni nanocaps evaporated on this curved surface.…”
Section: Introductionmentioning
confidence: 84%
“…There are several techniques for characterising the magnetic properties of individual 2D MNs, including VSM, 154 micro-Hall magnetometry, 155 MOKE magnetometry, 156 and diamond NV defect magnetometry. 157 Interestingly, Kerkache et al 158 compared the results of the MOKE technique and the VSM technique for measuring Ni/Cu nanofilms, observing that the data obtained by the MOKE technique describes the surface magnetism of the film, whereas the data obtained by the VSM technique describes the volume average of the entire film. In addition, scientists have favoured NV-based magnetic measurements for their ability to analyse local magnetic fields (excellent magnetic field sensitivity) ever since their first successful experimental demonstration in 2008, establishing their significance in magnetic studies of 2D MNs.…”
Section: D Magnetic Nanostructuresmentioning
confidence: 99%