We report on the structural and electronic properties of swift heavy ion (SHI) irradiated pristine TiO2 thin films, deposited by radio frequency magnetron sputtering on sapphire substrates. The high resolution x-ray diffraction and Raman measurements show a structural phase transition from anatase to admixture of brookite and rutile phases of TiO2 with increasing SHI fluence followed by a significant distortion in the TiO6 octahedra. The modification in the electronic structure stimulated by SHI irradiation has been investigated using x-ray absorption (XAS) experiments at the O K and Ti L3,2 absorption edges. The O K edge spectra clearly indicate the splitting of the pre-edge spectral features having t2g and eg symmetry bands due to structural disorder/distortion induced by irradiation. The intensity of the SHI generated components at the O K edge increases monotonically, which can be correlated to the modification in unoccupancies associated with O 2 p orbitals hybridized with Ti 3 d states. The XAS spectra at the Ti L3,2 edge further authenticate that SHI creates a controlled structural disorder/distortion in the TiO6 octahedra.
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