2007
DOI: 10.1063/1.2827181
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Molecular beam epitaxy of GaBiAs on (311)B GaAs substrates

Abstract: We report the growth by molecular beam epitaxy of GaBi x As 1−x epilayers on ͑311͒B GaAs substrates. We use high-resolution x-ray diffraction ͑HRXRD͒, transmission electron microscopy, and Z-contrast imaging to characterize the structural properties of the as-grown material. We find that the incorporation of Bi into the GaBiAs alloy, as determined by HRXRD, is sizably larger in the ͑311͒B epilayers than in ͑001͒ epilayers, giving rise to reduced band-gap energies as obtained by optical transmission spectroscop… Show more

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Cited by 52 publications
(30 citation statements)
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“…Bi content was found by combining X-ray diffraction [18], energy-dispersive X-ray spectroscopy, and photoluminescence [19]. More details of the samples are given elsewhere [20].…”
Section: Sample Detailsmentioning
confidence: 99%
“…Bi content was found by combining X-ray diffraction [18], energy-dispersive X-ray spectroscopy, and photoluminescence [19]. More details of the samples are given elsewhere [20].…”
Section: Sample Detailsmentioning
confidence: 99%
“…[1][2][3][4][5][6][7] This is because growers are currently confronted with some physical and technical issues that have thus far restricted the amount of Bi able to be introduced into the GaAs matrix. 8 The largest Bi incorporation experimentally reported has been x ¼ 0.22 for GaAs 1Àx Bi x films grown on bulk (100) GaAs substrate.…”
Section: Introductionmentioning
confidence: 99%
“…[2][3][4] This is largely due to the surface step structures exhibited by highindex crystal planes, which play an important role in the vapor-solid reaction processes and surface reconstruction. Certain surface reconstructions have been shown to affect the important mechanisms of epitaxial deposition 5 as well as the final bulk properties. 3 Studies of (hhl) crystal growths misoriented between (001) and (110) planes (see Fig.…”
Section: Introductionmentioning
confidence: 99%