2015
DOI: 10.1016/j.jcrysgro.2015.07.024
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Molecular beam epitaxy of InN nanowires on Si

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Cited by 10 publications
(5 citation statements)
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“…Therefore, it is clear that during the second step, the multiple small InN nanowires observed on sample A (Figure a) merge together to form one large diameter InN nanowire via Ostwald ripening. Evidence of such ripening was previously reported in the self-assembled growth of InN on Si . This merging process occurs because the small InN nanowires (on the top surface and sidewalls of GaN nanowires) are thermodynamically unstable at elevated temperature ( T sub = 460 °C).…”
Section: Results and Discussionmentioning
confidence: 62%
See 1 more Smart Citation
“…Therefore, it is clear that during the second step, the multiple small InN nanowires observed on sample A (Figure a) merge together to form one large diameter InN nanowire via Ostwald ripening. Evidence of such ripening was previously reported in the self-assembled growth of InN on Si . This merging process occurs because the small InN nanowires (on the top surface and sidewalls of GaN nanowires) are thermodynamically unstable at elevated temperature ( T sub = 460 °C).…”
Section: Results and Discussionmentioning
confidence: 62%
“…Moreover, the growth kinetics of InN significantly change with temperature making it more difficult to control morphology and material quality than for GaN , In an effort to circumvent these problems the use of nanostructures has been investigated, and InN nanowires have been demonstrated on Si, AlN, GaN, and even brass. These provide pure, high quality material, but lack the order and convenience of thin films. Nanowires have also been investigated as strain-compliant templates for the coalescence of reduced defect density films. , However, the wurtzite InN nanowires showed multiple crystalline rotations when grown on substrates with lower hexagonal symmetry, such as Si . Here, we explore the use of a top-down fabricated GaN nanowire template as a potential substrate for the growth of high material-quality InN.…”
mentioning
confidence: 99%
“…Three peaks were identified: the Si substrate peak coming from (111) planes, and two peaks from (0002) diffracting planes corresponding to the AlN and the InN. Dotted lines were positioned considering lattice parameters reported in the literature [14,21,22]. The peaks of the AlN layer and the InN NCs matched with the reported (dotted lines); therefore, we have NCs completely relaxed in hexagonal phase, which is consistent with the RHEED results.…”
Section: Results and Discussionmentioning
confidence: 99%
“…Thus far, most of the published work regarding InN growth is for temperatures higher than 400normalC [9,10,13,14]. For example, Kim et al performed a study of InN growth at 500normalC.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, it is of great importance to prepare regularly shaped InN NWs and gain a comprehensive understanding of their growth process. Although a few achievements have been obtained so far, more efforts are still required to understand the growth mechanism of nontapered InN NWs . Stoica and co‐workers have established a quasi‐equilibrium model to illustrate the relationship between the growth parameters and the morphologies of InN NWs.…”
Section: Introductionmentioning
confidence: 99%