Molecular resolution of a dioleoyl-Sn-glycero-phosphocholine lipid bilayer in liquid by phase modulation atomic force microscopy

Hoel, Antonin; Osaki, Toshihisa; Takeuchi, Shoji; Volz, Sébastian; Kawakatsu, Hideki

doi:10.1063/1.4745184

Cited by 3 publications

(2 citation statements)

References 14 publications

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“…E b , λ and Z 0 were numerically calculated from the acquired data. Details on the AFM can be found in the literature [33][34][35].…”

mentioning

confidence: 99%

Color Atomic Force Microscopy with on-the-fly Morse parameters mapping

Allain¹,

Damiron²,

Miyazaki³

et al. 2015

Preprint

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Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level, and 3D mapping of the potential field. However, fast identification of the surface still remains a challenging topic. In this paper, as a step towards implementation of such function, we introduce a control scheme and mathematical treatment of the acquired data that enable retrieval of essential information characterizing the potential field, leading to fast acquisition of images with chemical contrast. The control scheme is based on tip sample distance modulation at an angular frequency of ω, and null control of the 1ω component of the self excitation frequency of the oscillator. It is demonstrated that the control is robust in UHV for a frequency well as small as a few Hz/MHz, and that the mathematical treatment results in satisfactory identification of the potential field. Morse potential is chosen as a case study for identifying the Morse parameters per pixel. Atomic features with similar topography were distinguished by differences in the parameters. The decay length parameter was resolved with a resolution of 10 pm. The method was demonstrated on quenched Silicon at a scan rate comparable to normal imaging.

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“…E b , λ and Z 0 were numerically calculated from the acquired data. Details on the AFM can be found in the literature [33][34][35].…”

mentioning

confidence: 99%

Color Atomic Force Microscopy with on-the-fly Morse parameters mapping

Allain¹,

Damiron²,

Miyazaki³

et al. 2015

Preprint

Self Cite

View full text Add to dashboard Cite

show abstract

“…5 Although the time response of the phase shift (¦ª) in PM-AFM is also expected to be limited by the Q factor as well as that of the amplitude shift in AM-AFM, this aspect has not yet been studied in detail as far as we know. 6,[16][17][18][19][20][21][22][23][24] Thus, first, we theoretically and experimentally reviewed the Q-dependent time response of ¦ª and discussed the possibility of PM-AFM imaging in ILs using a quartz tuning fork sensor. We then demonstrated PM-AFM topographic imaging of a monolayer-covered Si(111) substrate as a model sample for nanometer-scale structural analysis in an IL.…”

Section: Introductionmentioning

confidence: 99%

Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

et al. 2014

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Structural analysis of the interfaces between an ionic liquid (IL) and an organic monolayer was carried out by phase modulation atomic force microscopy (PM-AFM). A quartz tuning fork sensor with a sharpened tungsten tip was used as a force sensor instead of a Si cantilever. Topographic imaging of the monolayer-covered Si(111) substrate revealed that the PM-AFM is capable of imaging the atomic steps originating from the substrate in an IL. We also carried out force curve measurement using the PM-AFM in order to directly confirm the presence of solvation layers and revealed that at least 4 layers, each with a thickness of 0.77 nm, were formed on the interface. In addition, we obtained topographic images at different driving frequencies and indicated that it is possible to image not only the sample surface but also the solvation layers formed on the IL/monolayer interface.

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Color atomic force microscopy: A method to acquire three independent potential parameters to generate a color image

Allain

Damiron

Miyazaki

et al. 2017

Applied Physics Letters

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Atomic force microscopy has enabled imaging at the sub-molecular level, and 3D mapping of the tip-surface potential field. However, fast identification of the surface still remains a challenging topic for the microscope to enjoy widespread use as a tool with chemical contrast. In this paper, as a step towards implementation of such function, we introduce a control scheme and mathematical treatment of the acquired data that enable retrieval of essential information characterizing this potential field, leading to fast acquisition of images with chemical contrast. The control scheme is based on the tip sample distance modulation at an angular frequency ω, and null-control of the ω component of the measured self-excitation frequency of the oscillator. It is demonstrated that this control is robust, and that effective Morse Parameters that give satisfactory curve fit to the measured frequency shift can be calculated at rates comparable to the scan. Atomic features with similar topography were distinguished by differences in these parameters. The decay length parameter was resolved with a resolution of 10 pm. The method was demonstrated on quenched silicon at a scan rate comparable to conventional imaging.

show abstract

Molecular resolution of a dioleoyl-Sn-glycero-phosphocholine lipid bilayer in liquid by phase modulation atomic force microscopy

Cited by 3 publications

References 14 publications

Color Atomic Force Microscopy with on-the-fly Morse parameters mapping

Color Atomic Force Microscopy with on-the-fly Morse parameters mapping

Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

Color atomic force microscopy: A method to acquire three independent potential parameters to generate a color image

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