Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations

Leinhos, J.; Arz, Uwe

doi:10.1109/arftg.2008.4633323

Cited by 11 publications

(2 citation statements)

References 7 publications

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“…A Monte Carlo calculation with 10000 iterations are conducted in the fixture S-parameter extracting and deembedding processes to evaluate the measurement uncertainty of S-parameters of the final TM 01 -TE 11 mode converter [34]. All the direct measurement quantities' uncertainty as Monte Carlo calculation's input are estimated according to N5244A's data sheet [32] and listed in Table II.…”

Section: Uncertainty Analysis and Conclusionmentioning

confidence: 99%

A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter

et al. 2020

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In the case of characterizing waveguide mode converter, the widely applied back-to-back method can only extract two mode converters' joint S-parameters, the accuracy of the far-field radiation pattern method is limited. This paper experimentally demonstrates a method for accurately characterizing single circular TM 01-TE 11 mode converter, which consists of extracting the asymmetric two-port TM 01 and TE 11 mode generator test fixtures' S-parameters and de-embedding them from the "TM 01 mode generator+ TM 01-TE 11 mode Converter+TE 11 mode generator" cascade measurement results. The peak problem occurring in measuring overmoded circular waveguide devices with VNA is analyzed and settled with an offset waveguide based peak-shifting tactic plus the Loess smoothing method. Fairly good agreement between the simulated and finally extracted complex S-parameter matrix of a TM 01-TE 11 mode converter throughout the device's working frequency span validates the proposed method's merits over traditional methods. INDEX TERMS asymmetric fixture, de-embedding, mode generator, overmoded mode converter, offset waveguide, S-parameter, thru-reflect-line (TRL) calibration.

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Section: Uncertainty Analysis and Conclusionmentioning

confidence: 99%

A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter

et al. 2020

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“…This calls for a careful scientific evaluation of the performances of the two applications. In fact, the reported solutions are limited to specific calibration algorithms [7]- [11] or use time-consuming Monte Carlo methods [12]- [15]. Other techniques are based on redundant measurements [16], [17] but do not give information on the amount and origin of the calibration residual uncertainty.…”

Section: Introductionmentioning

confidence: 99%

A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements

Teppati

Ferrero

2014

IEEE Trans. Instrum. Meas.

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An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution, have been introduced. In order to establish their suitability, a careful comparison is given for on-wafer measurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is presented for the first time.

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Improved permittivity measurement of dielectric substrates by use of the TE<inf>111</inf> mode of a split-cylinder cavity

Janezic

Arz

Begley

et al. 2009

2009 73rd ARFTG Microwave Measurement Conference

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Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations

Cited by 11 publications

References 7 publications

A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter

A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter

A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements

Improved permittivity measurement of dielectric substrates by use of the TE<inf>111</inf> mode of a split-cylinder cavity

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Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations

Cited by 11 publications

References 7 publications

A Method for Accurately Characterizing Single Overmoded Circular TM01-TE11 Mode Converter

A Method for Accurately Characterizing Single Overmoded Circular TM01-TE11 Mode Converter

A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements

Improved permittivity measurement of dielectric substrates by use of the TE<inf>111</inf> mode of a split-cylinder cavity

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A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter

A Method for Accurately Characterizing Single Overmoded Circular TM₀₁-TE₁₁ Mode Converter