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We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter measurements of coplanar waveguides of differing lengths. To validate this method, we compare with measurements performed using two different splitcylinder resonators and demonstrate agreement over a broad frequency range.

Combining a theory for reflection-free termination of coaxial lines together with a novel manufacturing method results in 1-mm coaxial matched loads with an excellent absorption behavior over the frequency range from 0 to 110 GHz. Three different electromagnetic (EM) simulation approaches verify the capability of these matched loads to achieve reflection coefficients smaller than 243 dB over the entire frequency range. Matched loads with a maximum reflection coefficient of only 232 dB have been produced. An excellent performance was achieved by exponentially tapering the outer conductor over the region of a coaxial ceramic substrate coated by a thin-film resistance and by compensation for EM wave propagation inside the resistive coating.

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