Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides

Leinhos, J.; Arz, Uwe

doi:10.1109/spi.2007.4512202

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Cited by 7 publications

(2 citation statements)

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“…However, provided the correct conductivity is used, the onwafer procedure is able to replicate the frequency dependence of the AF45 material properties investigated in [12].…”

Section: Measurement and Comparisonmentioning

confidence: 99%

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Arz

Leinhos

Janezic³

2008

2008 38th European Microwave Conference

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“…However, provided the correct conductivity is used, the onwafer procedure is able to replicate the frequency dependence of the AF45 material properties investigated in [12].…”

Section: Measurement and Comparisonmentioning

confidence: 99%

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Arz

Leinhos

Janezic³

2008

2008 38th European Microwave Conference

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“…Single line pair characterization methods have successfully been applied to printed transmission lines . However, due to the inkjet printing manufacturing tolerances and the half‐wave resonances, single line‐pair methods cannot consistently characterize printed transmission lines .…”

Section: Introductionmentioning

confidence: 99%

Application of a multiline material characterization method to inkjet printed electronics

Sillanpää

Rasku

Makinen

2013

Int J RF and Microwave Comp Aid Eng

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Material characterization has become increasingly important with the adoption of simulation-based workflow for microwave electronics design. This article focuses on the characterization of printable electronics materials using transmission-line measurements and demonstrates the capability of the multiline characterization method to separate dielectric and conductor losses when line geometry and material properties vary between the lines. The effects of multiline algorithm, number of line standards, and methods for selecting optimal line lengths are demonstrated. Consistent characterization results are obtained from inkjet-printed transmission lines on two different substrate materials. In addition, local conductor thickness variations are demonstrated as an effective way to decrease losses. Finally, the simulation-based procedure for determining the material properties is outlined and applied to printable electronics characterization.

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Uncertain eigenvalue analysis of the dielectric-filled waveguide by an interval vector finite element method

Wang

Jiang

et al. 2021

Sci. China Technol. Sci.

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Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides

Cited by 7 publications

References 7 publications

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Application of a multiline material characterization method to inkjet printed electronics

Uncertain eigenvalue analysis of the dielectric-filled waveguide by an interval vector finite element method

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