MoO3 layers — optical properties, colour centres, and holographic recording

Abstract

The spectral variations of optical absorption and refractive index are reported for thin layers of molybdenum trioxide prepared by evaporation in vacuum. These layers can be coloured by ultraviolet light and the absorption spectra of coloured layers show a single broad absorption band centred at 850 nm. The appearance of the colour centre absorption and the associated changes in the intrinsic edge have been used to record stable ‘thin’ holograms. A short discussion is given of the electronic structure of MoO3 and of the defects responsible for coloration.

Electrochromic phenomena in transition metal oxide thin films prepared by thermal evaporation

“…The most commonly used EO's are WO3 [2,[4][5][6][7][8][9] and MoO 3 [1, [10][11][12][13], while V205 thin films [15] have been used as IS layer in symmetric cells [16]. The use of mixtures of electrochromic oxides for the preparation of thin films, in order to obtain products with improved characteristics, is very promising [6][7][8].…”

Laser photodeposition of molybdenum oxide thin films from organometallic precursors

“…These materials can function as flat panel video displays [54][55][56], energy efficient "smart" window coatings [57], optical recording media [58], and lithographic resist films [59,60]. Electrically conducting MoO^ (x < 2) have recently shown promise as diffusion barriers in VLSI contact metallization schemes [61].…”

Low temperature coloration of WO3 and MoO3 thin films

“…Afterwards, the spectra were fitted in the range 1.14 - The analysis of the absorption spectra does not directly include the influence of reflection losses, since the magnitude of the latter is small and the range of the fits is selected such that the dispersion of the refractive index for the TMO films may not be taken into account [7,8]. The value of reflection losses is, however, simu- eV (see Fig.…”

“…The room temperature photochromic properties of a-WO3 and a-MoO 3 films with DMFA molecules adsorbed on their surface were described earlier [2,4]. The film thickness monitored during evaporation was measured by optical inspection of the interference fringes of the oxide films [7,8 ]. A value of the refractive index n = 2.2 was used for both materials [7,8].…”

“…The film thickness monitored during evaporation was measured by optical inspection of the interference fringes of the oxide films [7,8 ]. A value of the refractive index n = 2.2 was used for both materials [7,8]. The presence of the adsorbed DMFA molecules on the film surface could be estimated by IR-absorption spectroscopy [2,9].…”