The cathode electrocatalyst layers of polymer electrolyte membrane fuel cells (PEFCs) are quantitatively investigated for different ratios of Nafion ionomer. This is achieved using focused-ion-beam coupled scanning electron microscopy (FIB-SEM) to reconstruct the three-dimensional microstructure via tomography. Parameters such as the porosity and pore size distribution were calculated from this data. The distributions of Nafion ionomer, carbon support, and platinum nanoparticles were then further clarified using transmission electron microscopy (TEM). Changes in the PEFC performance (notably the I-V characteristics, the electrochemical surface area, the activation overvoltage, and the concentration overvoltage) are thus correlated to electrode microstructure. The electrocatalyst layers of PEFCs have complicated, threedimensional (3D) porous microstructure. This microstructure plays a key role in transporting reactant gases (i.e. hydrogen and oxygen), product water vapor, charge-carrying ions, and electrons either to or from the active sites. Therefore, the overall PEFC performance is linked inextricably to the 3D microstructure of the electrocatalyst layer, and in particular to the Nafion content.1 Making quantitative correlations between the Nafion ratio, the microstructure, and the cell performance is thus essential in order to optimize the performance and efficiency of PEFCs.The microstructure of electrocatalyst layers in PEFCs is generally studied by obtaining microtome sections, or by using focused-ionbeam (FIB) techniques.2-9 The diamond blade used in the microtome technique has the advantage of slicing through the electrocatalyst layer without inflicting thermal damage. However, it is difficult to cut through e.g. individual carbon particles using this method, meaning that the resulting cross-section is typically too rough to analyze the microstructure quantitatively.2 Meanwhile, clear and well-defined cross-sections can be obtained by FIB sectioning. However, in this case there remain difficulties in quantitative observation due to thermal damage and ion damage during the sputtering process, in which the gallium ion beam generates heat locally, melting or damaging the ionomer. This can be mitigated somewhat by cooling the sample using liquid nitrogen, as described by e.g. Katayanagi et al.
2,9Electron microscopy and X-ray computed tomography (CT) are two other common methods to observe electrocatalyst layers in PEFCs. For example, Wargo et al. observed electrocatalyst layers using both nano-CT and FIB-SEM techniques, 3 whilst Litster et al. observed electrocatalyst layers using high-resolution (50 nm) nano-CT. 4 Despite CT having the distinct advantage of being a non-destructive technique, it has the disadvantage of inferior resolution compared with SEM, TEM, or scanning transmission electron microscope (STEM).Therefore, in this study we focus on sectioning samples by FIB, and performing observation using electron microscopy. FIB-SEM has already been utilized as a powerful tool to observe the microstruct...