High-contrast alignment marks are
promising optical elements for
the high-precision alignment of X-ray gratings in phase-contrast X-ray
imaging systems. These marks contain micrometer-scale bands of optically
absorptive and reflective areas that determine their relative degree
of optical contrast. Nanostructured black silicon (n-BSi) enabling
the broadband, quasi-omnidirectional absorption of light, is a promising
material to define these absorptive areas. In this work, we have developed
an optimized deep reactive-ion etching (DRIE) process to fabricate
n-BSi for these alignment marks. The DRIE process was optimized by
systematically changing the polymer deposition time, T, while keeping all other process conditions constant. As T varied from 0.6 to 2.5 s, three distinct etching regimes
were observed: (1) smooth etching, (2) n-BSi, and (3) etching stop.
During the n-BSi regime (T = 1.6 to 2.1 s), varying T altered the n-BSi morphology, resulting in a broad spectrum
of nanostructures: nanopillars to nanopores. Our investigation of
the process–structure–property relationships among the
process etching, morphology evolution, and reflectance of n-BSi revealed
that morphologies with an increased height, aspect ratio, and degree
of tapering and a lower base spacing were most effective at suppressing
reflection for λ = 500–800 nm. Our results demonstrated
the lowest reflectance of the absorptive areas,
= 0.01 (∼1%) and
= 0.03 (relative with respect to Si) at
λ = 600 nm for T = 1.9 s (100 cycles), thus
giving the highest contrast ratio, ϕ = 0.9. To increase the
device throughput, we varied the cycle number from 5 to 100 times
at T = 1.9 s to study its effect on growth, morphology,
and reflectance of n-BSi. Our results demonstrate that
,
, and ϕ plateaued at 50 cycles, cutting
in half our total fabrication time, t. In addition,
our alignment marks demonstrated rotational and translational precision
alignment capabilities. Lastly, we present two design principles for T and the cycle number to fabricate the optimal n-BSi morphology
for the targeted application using any DRIE tool.