Morphology and interdiffusion behavior of evaporated metal films on crystalline diindenoperylene thin films

Abstract

We present a transmission electron microscopy ͑TEM͒/Rutherford backscattering spectrometry ͑RBS͒/x-ray-diffraction ͑XRD͒ study of Au evaporated on crystalline organic thin films of diindenoperylene ͑DIP͒. Cross-sectional TEM shows that the preparation conditions of the Au film ͑evaporation rate and substrate temperature͒ strongly determine the interfacial morphology. In situ XRD during annealing reveals that the organic layer is thermally stable up to about 150°C, a temperature sufficient for most electronic applications. The x-ray measurements show that the ''as-grown'' Au layer exhibits a large mosaicity of around 10°. Upon annealing above Ϸ120°C the Au film starts to reorder and shows sharp ͑111͒-diffraction features. In addition, temperaturedependent RBS measurements indicate that the Au/DIP interface is thermally essentially stable against diffusion of Au in the DIP layer up to Ϸ100°C on the time scale of hours, dependent on the Au thickness.

Organic–Organic Heterostructures: Concepts and Applications

“…Finally, a complete device features, in addition to an organic heterostructure, further layers, for example, electrodes, layers for improving conductivity, passivation layers, blocking layers and so forth ( Figure 9). These add further challenges such as the controlled growth of metals on organic materials, [229,230] but a detailed discussion of these issues is beyond the scope of this review.…”

Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth

“…Thin DIP films have been found to exhibit high structural order [10] but also rapid roughening after initial layer-by-layer growth [11][12][13]. Encapsulation of DIP thin films has been employed for increased device stability [14,15], and contact formation as well as electronic structure at contacts [16][17][18][19][20] have been studied. Its molecular orientation on insulators [12,21] and metals [20,22,23] has been measured, and high-resolution transmission electron microscopy (TEM) [24] and scanning tunneling microscopy (STM) [25] images give insight into the molecular arrangement.…”

“…In this work we study the semiconductor diindenoperylene (DIP, C 32 H 16 ), which shows promising charge-carrier mobilities of up to 0.1 cm 2 /V s [5,6]. Its temperaturedependent bulk crystal structures have recently been solved [4] and the exciton diffusion length has been determined [7].…”

3D imaging of filaments in organic resistive memory devices

“…Filament formation may be driven by electrochemical migration of metal cations in the insulating layer [34,35], the migration of anions inducing a stoichiometry (or valence) change [36], the change of stoichiometry by thermochemical reactions caused by the local temperature increase or by field assisted sputtering from pre-formed point-like geometries [37]. Previous studies on the diffusion of evaporated metals on organic layers have evidenced kinetic/thermal mediated diffusion, and preferential diffusion at surface defects [38,39].…”