indicate the realistic possibility of new soft matter technologies. Note that these highperformance laboratory devices are often produced via spin-coating, a reliable fabrication process that enables rapid prototyping and basic research. However, the transition to high throughput film fabrication processes such as blade-coating, roll-to-roll printing, and others will require understanding of film morphology-forming mechanisms operative in spin-coating processes that optimize organic device performance. [13] Traditionally, optimizing device performance relied on empirical screening of spin-casting para meters such as solvent, processing additive, and spin speed, followed by postprocessing analysis of which morphologies are produced by which coating conditions. [14][15][16] For OSC film morphology, grazing incidence wide-angle X-ray scattering (GIWAXS) is especially powerful for monitoring crystallinity, orientation, donor-acceptor intermixing, [14][15][16][17][18] and developing an ex post facto understanding basis for otherwise completely empirical "recipes." While informative, postdeposition analysis can miss important temporal characteristics of film growth processes which can only be identified by in situ techniques. In situ film growth studies utilizing GIWAXS and other techniques during film deposition and drying have been employed by several groups, including our own, to understand crystalline morphology development in organic electronic thin films. [19,20] Characterizing morphology during the film formation process can elucidate important mechanistic pathways and inform rational solution processing parameter optimization.Several recent studies have reported in situ optical and X-ray analyses of organic film growth by roll-to-roll printing, [21] blade To elucidate the details of film morphology/order evolution during spin-coating, solvent and additive effects are systematically investigated for three representative organic solar cell (OSC) active layer materials using combined in situ grazing incidence wide angle x-ray scattering (GIWAXS) and optical reflectance. Two archetypical semiconducting donor (p-type) polymers, P3HT and PTB7, and semiconducting donor small-molecule, p-DTS(FBTTh 2 ) 2 are studied using three neat solvents (chloroform, chlorobenzene, 1,2-dichlorobenzene) and four processing additives (1-chloronaphthalene, diphenyl ether, 1,8-diiodooctane, and 1,6-diiodohexane). In situ GIWAXS identifies several trends: 1) for neat solvents, rapid crystallization occurs that risks kinetically locking the material into multiple crystal structures or crystalline orientations; and 2) for solvent + additive processed films, morphology evolution involves sequential transformations on timescales ranging from seconds to hours, with key divergences dependent on additive/ semiconductor molecular interactions. When π-planes dominate the additive/semiconductor interactions, both polymers and small molecule films follow similar evolutions, completing in 1-5 min. When side chains dominate the additive/semiconductor...