Morphology of the asymmetric iron–silicon interfaces

Badía-Romano, L.; Rubín, Javier; Bartolomé, Fernando; Magén, Cesar; Bartolomé, J.; Варнаков, С. Н.; Овчинников, С. Г.; Rubio-Zuazo, J.; Castro, G.R.

doi:10.1016/j.jallcom.2014.12.019

Cited by 7 publications

(4 citation statements)

References 67 publications

(138 reference statements)

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“…Therefore, mixing and diffusion at the interface could be the main factor responsible for such magnetization reversal with a reduced Kerr signal. This reduced magnetization is per the studies in the literature, where the formation of the nonmagnetic FeSi phase at the interface was found responsible for decreased magnetization after annealing 46,47 and ion beam irradiation 48 . However, MOKE is incapable of resolving interface magnetism separately.…”

Section: Resultssupporting

confidence: 87%

Interface magnetism in Fe/Alq3 bilayer; interface resolved nuclear resonance scattering studies

Khanderao

Kaushik

Dev

et al. 2022

Journal of Magnetism and Magnetic Materials

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Section: Resultssupporting

confidence: 87%

Interface magnetism in Fe/Alq3 bilayer; interface resolved nuclear resonance scattering studies

Khanderao

Kaushik

Dev

et al. 2022

Journal of Magnetism and Magnetic Materials

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“…There is also a "pre-peak" observed on the LBE side. This "pre-peak" has previously been observed in a Si 1s iron silicide spectra [15]. Following the 300°C anneal the Co 2 Si phase grows significantly while the bulk Si component peak reduces as it is consumed to form more silicide.…”

Section: B the Si-co Interfacesupporting

confidence: 61%

Characterisation of Electroless Deposited Cobalt by Hard and Soft X-ray Photoemission Spectroscopy

O’Connor

Armini

Selvaraju

et al. 2018

2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)

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Electroless deposited (ELD) cobalt with palladium as a catalyst, and an underlying self-assembled monolayer (SAM) was investigated for potential use in advanced complementary metal oxide semiconductor (CMOS) applications using both hard (HAXPES) and soft (XPS) x-ray photoelectron spectroscopy. HAXPES spectra established the uniformity of the deposited Co film and the nature of the buried Co-Si interface ~20nm below the surface. The Pd is seen to diffuse through the Co following thermal annealing. While the deposited Co film is predominantly metallic, Co-silicide forms at the Co-Si interface upon deposition and decomposes with thermal anneal up to 500°C.

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“…The Si 2p spectrum for the neat stone was fitted to the two peaks ( Fig. 23a), corresponding to silica (103.1 eV) and phyllosilicate impurities (100.8 eV) [266]. The Si 2p spectrum of pure Alpha ® SI30 (Fig.…”

Section: X-ray Photoelectron Spectroscopymentioning

confidence: 99%

Recent progress in instrumental techniques for architectural heritage materials

et al. 2019

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Both conservation and intervention methods must be compatible with each other and appropriate for the original building materials. Therefore, the characterization of historic building materials is indispensable for investigating chemical composition, micro-structure and morphological features to study the current condition, environmental influence and change mechanism due to natural aging or man-made decay processes. Given the great variety of chemicals which can be analyzed, complex problems related to architectural heritage materials are investigated via optimized methodologies. Among the existing techniques, optical microscopy (OM) is an inexpensive and dominating tool to obtain preliminary information on complex samples. Atomic force microscopy (AFM) can provide real three-dimensional topographies showing sample surface properties. Electron microscopes combined with energy dispersion X-ray analysis (EM-EDX) are the instruments specifically developed to acquire images of target materials at high magnification. Infrared and Raman spectroscopies are frequently used to characterize inorganic and organic compounds. Thermal analysis can rapidly and accurately measure changes in crystalline structure, dehydration and decomposition. X-ray based technologies have a wide range of applications as follows. X-ray fluorescence (XRF) is one of the most frequently used techniques for elemental analysis. X-ray diffraction (XRD) is a fast and inexpensive technique for the characterization of man-made and natural materials. X-ray photoelectron spectroscopy (XPS) is applied to quantify the valence and electronic levels of specific elements. X-ray absorption spectroscopy (XAS) is a powerful technique for detecting the electronic structure of matter. UV-visible (UV-vis) spectroscopy is also of great importance in architectural heritage, which can reveal different physicochemical mechanisms causing color. Laserinduced breakdown spectroscopy (LIBS) can effectively eliminate the pollution on the surface and detect the internal elements of the target material. Ion beam analysis can quantify trace elements with high sensitivity. Mass-based techniques are mainly applied to identify unknown organic substances at the molecular level. This review describes some classical applications of individual techniques and provides scientific support for scientists and engineers to make decisions in the context of architectural heritage.

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Morphology of the asymmetric iron–silicon interfaces

Cited by 7 publications

References 67 publications

Interface magnetism in Fe/Alq3 bilayer; interface resolved nuclear resonance scattering studies

Interface magnetism in Fe/Alq3 bilayer; interface resolved nuclear resonance scattering studies

Characterisation of Electroless Deposited Cobalt by Hard and Soft X-ray Photoemission Spectroscopy

Recent progress in instrumental techniques for architectural heritage materials

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