Moving from mixed signal to RF test hardware development

Direct and Indirect Classification of High-Frequency LNA Performance using Machine Learning Techniques

“…While advances in technology and market requirements has seen rapid growth in high-frequency and high integration RFIC designs, testing practice has not followed suit. Indeed, reliable high-frequency testing has become the dominant factor in the cost and time-to-market of novel wireless products [1]. Consequently, developing cost-efficient testing solutions is becoming an increasing important research topic [2][3][4].…”

Inferential estimation of high frequency LNA gain performance using machine learning techniques

“…Reliable high frequency testing of radio frequency integrated circuits (RFIC) has become a significant factor in the cost and time-to-market of novel wireless products [1]. Testing of RFICs is generally performed using dedicated automatic test equipment (ATE) that record a set of measurements with the circuits operating in their functional mode so that performance can be compared against design specifications.…”

A built-in-test circuit for functional verification & PVT variations monitoring of CMOS RF circuits

“…There are two main problems for the testing of RF circuits; relaying the multi-gigahertz RF signal to the external tester without affecting the performance of RF circuit under test; and prohibitively expensive RF production testers. Reliable high frequency testing has become a significant restrictive and influential factor for the time-to-market of novel wireless products [1][2][3]. Therefore, in order to reduce the time and cost, it is important to find an easier way to do the functional verification of RF circuits.…”