2017 7th IEEE International Conference on Electronics Information and Emergency Communication (ICEIEC) 2017
DOI: 10.1109/iceiec.2017.8076612
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Multi-chain time interval measurement method utilizing the dedicated carry chain of FPGA

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Cited by 4 publications
(3 citation statements)
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“…This article uses a Xilinx Kintex-7 series FPGA to implement the carry delay chain, whose model is XC7K325TFFG676-2. The dedicated carry chain primitive CARRY4 [19], provided by Xilinx, is used to instantiate the carry delay chain without customizing the IP cores, whose structure is shown in Figure 4.…”
Section: The Implementation Of the Carry Delay Chainmentioning
confidence: 99%
See 1 more Smart Citation
“…This article uses a Xilinx Kintex-7 series FPGA to implement the carry delay chain, whose model is XC7K325TFFG676-2. The dedicated carry chain primitive CARRY4 [19], provided by Xilinx, is used to instantiate the carry delay chain without customizing the IP cores, whose structure is shown in Figure 4.…”
Section: The Implementation Of the Carry Delay Chainmentioning
confidence: 99%
“…This article uses a Xilinx Kintex-7 series FPGA to implement the carry delay chain, whose model is XC7K325TFFG676-2. The dedicated carry chain primitive CARRY4 [19], provided by Xilinx, is used to instantiate the carry delay chain without customizing the IP cores, whose structure is shown in Figure 4. By recording the signal at the tap of the carry delay chain, the actual number of delay units passed by the external trigger signal can be obtained.…”
Section: The Implementation Of the Carry Delay Chainmentioning
confidence: 99%
“…But the detection of the synchronous signal makes the measurement process hard to track the change of frequency in time, resulting in the discontinuity of the Larmor frequency output. Besides, Ge et al [18,19] proposed the delay chain interpolation method and Torres et al [20,21] used the time-to-digital (TDC) converter device to compensate the measurement error by using delay line technique. However, the delay line is easily affected by the temperature and power supply voltage, and the measured value will have a drift over time [22].…”
Section: Jinst 16 P06001mentioning
confidence: 99%