2008 11th Workshop on Control and Modeling for Power Electronics 2008
DOI: 10.1109/compel.2008.4634691
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Multi-domain simulation of transient junction temperatures and resulting stress-strain behavior of power switches for long-term mission profiles

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Cited by 10 publications
(6 citation statements)
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“…The relation (9) gives the lifetime model ( ) with a dependence on the stresses, i.e. junction temperature variations (∆ ) and heating duration ( ).…”
Section: Lifetime Estimation and Extrapolation For Low ∆mentioning
confidence: 99%
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“…The relation (9) gives the lifetime model ( ) with a dependence on the stresses, i.e. junction temperature variations (∆ ) and heating duration ( ).…”
Section: Lifetime Estimation and Extrapolation For Low ∆mentioning
confidence: 99%
“…To this end, numerous lifetime models of power electronic devices have been developed. They can be divided in three categories: empirical models [6][7][8], physics-based models [9][10][11][12][13][14][15][16][17][18] and datadriven or stochastic models [19][20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
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“…Rapid multi-domain physical simulation is the key enabling technology for virtual prototyping and virtual design optimization; simulations are needed to predict the effect that design choices -the choice of components, materials and geometrical design -have on overall system performance. Typical physical domains that are of interest in power electronic systems include electrical parasitics [1,2], EMI [3,4], electric field in high voltage designs [1], thermal [5] and mechanical [6,7]. The speed of these multi-domain simulations is important as it will determine the speed and ease of use of the virtual prototyping process.…”
Section: A Requirements For Virtual Prototyping and Virtual Designmentioning
confidence: 99%
“…The study of reliability and failure mechanisms of PE systems is a complicated multidisciplinary task [9]. Work concerning the failure and lifetime estimation of PE in different applications has been previously done and various models have been created [9]- [13]. This previous work has identified temperature cycling in the device structure as one of the most critical failure causes in PE systems.…”
Section: Introductionmentioning
confidence: 99%