2015
DOI: 10.1016/j.optlaseng.2014.09.018
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Multi-frequency inverse-phase fringe projection profilometry for nonlinear phase error compensation

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Cited by 66 publications
(17 citation statements)
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“…When such measurements are used to inform decisions regarding part acceptance, maintenance, or usage, it is important to understand and quantify uncertainties in the measurement process prior to implementation. Potential sources for measurement uncertainty in the DFP method include projector gamma nonlinearity [9][10][11], projector and camera quantization effects [12][13][14], and pixel intensity noise [15][16][17][18]. Substantial work has been made to quantify and mitigate the height profile measurement error caused by non-linear projector gamma [19][20][21][22] and other publications address measurement uncertainty and mitigation caused by projector and camera quantization [23][24][25].…”
Section: Introductionmentioning
confidence: 99%
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“…When such measurements are used to inform decisions regarding part acceptance, maintenance, or usage, it is important to understand and quantify uncertainties in the measurement process prior to implementation. Potential sources for measurement uncertainty in the DFP method include projector gamma nonlinearity [9][10][11], projector and camera quantization effects [12][13][14], and pixel intensity noise [15][16][17][18]. Substantial work has been made to quantify and mitigate the height profile measurement error caused by non-linear projector gamma [19][20][21][22] and other publications address measurement uncertainty and mitigation caused by projector and camera quantization [23][24][25].…”
Section: Introductionmentioning
confidence: 99%
“…It has motivated development of new phase-shifting algorithms [17,18], and has been reported to dominate the error contributions from camera and projection quantization error [29]. Even with the development of nonlinear gamma error reduction, measurement uncertainty contributions from noise in the pixel field is unavoidable [15]. However, to the authors' knowledge, no work has been published which explicitly provides a forward analytical model of the measurement height uncertainty caused by phase noise.…”
Section: Introductionmentioning
confidence: 99%
“…Several sources of error effect the accuracy of DFP measurement, including nonlinear projector gamma [17][18][19], phase-to-height calibration error [20,21], and pixel intensity noise caused by fluctuation in environmental lighting during DFP measurement and electronic noise within the camera and projector [22][23][24][25]. The current work is focused on quantifying phase error converted from pixel intensity noise, a source of error affecting a wide range of profiling techniques [23].…”
Section: Introductionmentioning
confidence: 99%
“…Three-dimensional (3D) surface profiles can be obtained by using non-contact and highaccuracy fringe projection profilometry (FPP), which finds a wide variety of applications such as biological and medical imaging, computer vision and so on [1][2][3]. It is well known that the FPP heavily relies on the recovered phase, so that phase measuring profilometry (PMP) is generally a crucial process.…”
Section: Introductionmentioning
confidence: 99%