2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) 2016
DOI: 10.1109/edm.2016.7538767
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Multi-functional control integrated circuits in 250 nm BCD technology for high-efficiency power converters

Andrey A. Antonov
1
,
Maksim S. Karpovich
2
,
Igor V. Pichugin
3
et al.
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Cited by 8 publications
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References 6 publications
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“In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

Antonov
1
,
Karpovich
2
,
Pichugin
3
et al. 2016
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
4
0
0
0
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“In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

Antonov
1
,
Karpovich
2
,
Pichugin
3
et al. 2016
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
4
0
0
0
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A ZVS/ZCS Hybrid Driver Integrated Circuit in 250 nm BCD Technology for Energy-Efficient Switch Mode Power Supply Units

Antonov
1
,
Surin
2
,
Pichugin
3
et al. 2018
2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
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Test Chip Development for Evaluation of 180 nm SiGe Integrated Circuit Technology Operation Under Cryogenic Conditions

Cherepanov
1
,
Vasilyev
2
2018
2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
2
0
0
0
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