2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS) 2012
DOI: 10.1109/memsys.2012.6170114
|View full text |Cite
|
Sign up to set email alerts
|

Multi-functional integrated sensors for the environment

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0
2

Year Published

2012
2012
2016
2016

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 14 publications
(9 citation statements)
references
References 7 publications
0
7
0
2
Order By: Relevance
“…Then a wafer bonding to the backside is implemented to finally seal the cavity [14]. To avoid non-uniform etching depth from the backside in batch wafer process, SOI wafers are utilized, in which the buried oxide layer acts as a built-in etch-stopping layer [13]. However, backside processing plus wafer bonding on SOI wafer will increase the foundry fabrication cost dramatically.…”
Section: Design Strategy For Monolithic Composite Sensormentioning
confidence: 99%
See 1 more Smart Citation
“…Then a wafer bonding to the backside is implemented to finally seal the cavity [14]. To avoid non-uniform etching depth from the backside in batch wafer process, SOI wafers are utilized, in which the buried oxide layer acts as a built-in etch-stopping layer [13]. However, backside processing plus wafer bonding on SOI wafer will increase the foundry fabrication cost dramatically.…”
Section: Design Strategy For Monolithic Composite Sensormentioning
confidence: 99%
“…), have imposed great challenges in commercializing integrated composite sensor products. In addition, several developed integration techniques utilized double-sided micromachining process [12] and even silicon-on-insulator (SOI) wafers [13], which are not favorable for low-cost mass production for sensing networks. Thus, a design/fabrication platform module with low-cost integrated-process solutions is highly desirable.…”
Section: Introductionmentioning
confidence: 99%
“…The fundamental transverse resonant frequency f 0 of a free-free beam is given by (1) where E is the Young's modulus, ρ is the mass density of the beam material, and L/b/t are the length/width/thickness of the beam. I a is the area moment of inertia (i.e., bt³/12, for a beam with a rectangular cross-section), m the mass per unit length (i.e.…”
Section: A Principle Of Operationmentioning
confidence: 99%
“…From the simple 1-axis accelerometer, IMUs have evolved to provide 3 degrees-offreedom (DOFs) accelerometer sensing and eventually to 6DOFs modules, including angular rate sensors. In particular, the synergy of multi-DOF inertial sensors turned out to be key in improving the navigation capabilities of inertial modules The trend towards development of multi-DOF modules goes on [1]. On-chip magnetometers are seen as key components to further improve the performance of IMUs and navigation modules.…”
Section: Introductionmentioning
confidence: 99%
“…In industry, new commercial sensors like the Analog Devices ADIS16405 and the STMicroelectronics LSM33D combine three-axis gyroscopes, accelerometers, and magnetometers in a single package. In our lab, we have previously developed a multifunctional sensor called MFISes [2][3] that measures ten parameters on a single chip: temperature, humidity, light intensity, pressure, air speed, air flow direction, magnetic field, and three-axis acceleration ( Table 1). MFISes is an ideal platform for crosssensitivity experiments because the sensors are integrated on a single device and experience identical test conditions without gradients or time delay.…”
Section: Introductionmentioning
confidence: 99%