Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures

Dedkov, Yuriy; Voloshina, Elena

doi:10.1039/c3cp54541e

Cited by 26 publications

(48 citation statements)

References 100 publications

(210 reference statements)

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“…For BLG0°/Ir(111) the calculated DOS and charge distribution for the interface graphene layer are in agreement with the previously published results, indicating the p‐doping of the graphene layer and the formation of several states at the interface as a results of the orbital overlap of C‐int. p z and Ir 5d z 2 states.…”

Section: Resultssupporting

confidence: 90%

Layer‐by‐Layer Decoupling of Twisted Graphene Sheets Epitaxially Grown on a Metal Substrate

Simon

Voloshina

Tesch

et al. 2018

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The electronic properties of graphene can be efficiently altered upon interaction with the underlying substrate resulting in a dramatic change of charge carrier behavior. Here, the evolution of the local electronic properties of epitaxial graphene on a metal upon the controlled formation of multilayers, which are produced by intercalation of atomic carbon in graphene/Ir(111), is investigated. Using scanning tunneling microscopy and Landau-level spectroscopy, it is shown that for a monolayer and bilayers with small-angle rotations, Landau levels are fully suppressed, indicating that the metal-graphene interaction is largely confined to the first graphene layer. Bilayers with large twist angles as well as twisted trilayers demonstrate a sequence of pronounced Landau levels characteristic for a free-standing graphene monolayer pointing toward an effective decoupling of the top layer from the metal substrate. These findings give evidence for the controlled preparation of epitaxial graphene multilayers with a different degree of decoupling, which represent an ideal platform for future electronic and spintronic applications.

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Section: Resultssupporting

confidence: 90%

Layer‐by‐Layer Decoupling of Twisted Graphene Sheets Epitaxially Grown on a Metal Substrate

Simon

Voloshina

Tesch

et al. 2018

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“…The best fit between simulations and SXRD data is achieved for an iridium undulation in phase with the graphene one, with a smaller amplitude though. This finding is at variance with that obtained in earlier scanning probe microscopy measurements performed in specific imaging conditions, 9 and supports the picture progressively assembled through other reports, based on scanning probe microscopies, 10,28 XSW, 8 and first principle calculations.…”

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confidence: 57%

“…Atomic force microscopy has proven to be a valuable alternative, provided it is performed with care, especially with respect to the possible chemical interaction between tip and sample. 10,11 Scattering techniques, such as low-energy electron diffraction (LEED), surface Xray diffraction (SXRD), and X-ray standing waves (XSW), are free of such probe-induced perturbations of the systems. To the expense of complex calculations in the framework of the dynamical theory of diffraction, LEED was used to assess the topography of graphene/Ru(0001) 12 and graphene/Ir(111).…”

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confidence: 99%

Topography of the graphene/Ir(111) moiré studied by surface x-ray diffraction

et al. 2015

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The structure of a graphene monolayer on Ir(111) has been investigated in situ in the growth chamber by surface x-ray diffraction including the specular rod, which allows disentangling the effect of the sample roughness from that of the nanorippling of graphene and iridium along the moir-like pattern between graphene and Ir(111). Accordingly we are able to provide precise estimates of the undulation associated with this nanorippling, which is small in this weakly interacting graphene/metal system and thus proved difficult to assess in the past. The nanoripplings of graphene and iridium are found in phase, i.e. the in-plane position of their height maxima coincide, but the amplitude of the height modulation is much larger for graphene (0.379 ± 0.044Å) than, e.g., for the topmost Ir layer (0.017 ± 0.002Å). The average graphene-Ir distance is found to be 3.38 ± 0.04Å.Graphene, a monoatomic layer of carbon atoms arranged in a honeycomb lattice, has been investigated thoroughly in the past ten years because of its exceptional properties, which hold promises for numerous applications.1 Transition metal surfaces form a broad family of substrates for the growth of large area, high quality graphene.2 New properties can be induced in graphene through the interaction with the substrate, e.g. electronic bandgaps, 3 spin-polarization 4 and superconductivity.5 In most graphene-on-metal systems, the interaction is modulated at the nanoscale, due to lattice mismatch between graphene and the metal, which results in twodimensional patterns with periodicity of the order of nanometers, often referred to as "moirs", following an analogy with the beating of optical waves through two mismatched periodic lattices (e.g. tissue veils). Knowledge on the topographic properties of these moirs, i.e. the average graphene-metal distance, and the perpendicular-to-the-surface amplitude of the graphene and metal undulations across the moir, is desirable in view of characterizing the interaction and rationalizing the other properties.

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“…1(d). 5,13,18 Switching over to the simulated AFM image for the asymmetric tip apex, a significant change in contrast becomes apparent involving the following aspects [ Fig. 1(d) that differ substantially for the two tip configurations.…”

Section: Resultsmentioning

confidence: 99%

Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

Uluutku

Baykara

2015

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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The effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic force microscopy measurements of graphitic surfaces has been investigated via numerical simulations. Employing a three-dimensional, crystalline, metallic tip apex and a two-layer thick graphene sample as a model system, basic calculations of the tip-sample interaction have revealed a significant effect of tip asymmetry on obtained results, including artificial modulation of site-specific chemical interaction forces and spatial distortion of observed features. Related artifacts are shown to be enhanced for tips with low lateral stiffness values. Our results emphasize that potentially erroneous interpretations of atomic-scale surface properties via imaging and spectroscopy measurements can be caused or enhanced by tip asymmetry. © 2015 American Vacuum Society

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Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures

Cited by 26 publications

References 100 publications

Layer‐by‐Layer Decoupling of Twisted Graphene Sheets Epitaxially Grown on a Metal Substrate

Layer‐by‐Layer Decoupling of Twisted Graphene Sheets Epitaxially Grown on a Metal Substrate

Topography of the graphene/Ir(111) moiré studied by surface x-ray diffraction

Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

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