Multifractal analysis of areas of spatial forms on surface of Zn Cd1−Te–Si (111) heterocompositions

Special features in the application of fractal analysis for examining the surface microrelief formed at face milling

“…In this case, coordinates of the points of surface relief, information about which is contained in each pixel of the photograph, were used to calculate the surface area between adjacent pixels in accordance with the method of triangulation. The appropriate software was developed, tested and applied in [8,9] for the realization of multifractal parametrization of the surface area of semiconductor film structures. In the present work, to describe the surface condition of samples, we used fractal analysis, not the MF as in [8,9].…”

“…The appropriate software was developed, tested and applied in [8,9] for the realization of multifractal parametrization of the surface area of semiconductor film structures. In the present work, to describe the surface condition of samples, we used fractal analysis, not the MF as in [8,9]. This was achieved by the simplification of developed software, assuming the magnifying number q in a MF analysis constant and equal to unity.…”

“…This was achieved by the simplification of developed software, assuming the magnifying number q in a MF analysis constant and equal to unity. It is necessary to note that the software from [8,9] in the description of fractal properties of the surface area yields the same quantitative magnitudes as the known computational package «Gwyddion» [18].…”

“…A calculation of fractal dimensions for the specified parameter of the system was performed by the rough partition method by a standard procedure [8,9,11,12]. In this case, for a cell of the assigned size, a statistical sum was formed:…”

“…Among the theoretical directions in the studies of the surface microrelief state, of special interest are the series of articles that deal with the application of sufficiently new, nontrivial mathematical methods for analysis of the surface relief state [1][2][3][4][5][6][7]. They include papers on the application of fractal representations to the description of the self-similar states, which are formed either naturally, for example, due to the reflection by the surface of crystallographic properties of the volume of material of the base layer [8,9], or due to the periodic action on the surface of machnining tool [10,11].…”