Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates

Abstract

This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness of copper (II) tetrasulfophthalocyanine (CuTsPc) films on the indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films were prepared by drop cast method on ITO substrate. CuTsPc films surface roughness was studied by AFM in tapping-mode ™ , in air, on square areas of 2500 μm 2 . A novel approach, on the basis of computational algorithms for analysis of 3D roughness surface applied for AFM data, was presented. Results revealed that the 3D surface roughness of CuTsPc films prepared by drop cast method on ITO substrate can be described using the multifractal geometry. The generalized dimensions D q and the multifractal spectrum f(α) provided quantitative values that characterize the local scale properties of CuTsPc films surface geometry at nanometer scale. Data provide valuable information to describe the spatial arrangement of 3D surface roughness of CuTsPc films on ITO substrate, which was not taken into account by classical surface statistical parameters.

Uniformity analysis in nanocrystalline silver thin films using fuzzy inference system

“…It is a much reliable method for providing greater details about the thin film nanostructure compared with conventional methods. Multifractal approaches have been recently used for characterization of structural complexity of three-dimensional surface roughness using AFM images in Ţălu et al [19,20] Fractal analysis is another recently used approach for surface characterization in Ţălu et al [21] The experimental details of the proposed approach are explained in the succeeding texts.…”

Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution

“…The 3D surface micromorphology may be described in terms of its fractal geometry, which is a field of modern mathematics that uses non-integer dimensions to characterize the irregularity of a 3D complex surface geometry [19][20][21][22] . Furthermore, due to easy implementation, high precision and low computational time, the fractal analyses allow extracting different types of information from 3D complex surface characteristics, in contrast to traditional statistical parameters [23][24][25] . The 3D fractal surfaces possess the properties of continuity, non-differentiability, self-similar and self-affinity and can be quantitative estimated by fractal dimension (an intrinsic property of the surface, which is independent of the resolution of the instrument used) [26][27][28] .…”

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“…Atomic force microscopy (AFM) is an effective very‐high‐resolution tool in the investigation of surface structure (Méndez, Reyes, Trejo, Stępień, & Ţălu, ; Naseri et al, ; Sobola, Ţălu, Solaymani, & Grmela, ; Stach et al, ; Ţălu et al, ). Analysis of high resolution AFM images by image processing technique can reveal the specific distribution pattern and complexity of the 3‐D surface structures (Smagoń et al, ; Solaymani et al, ; Ţălu et al, ; Zavarian et al, ).…”