2022
DOI: 10.1002/aelm.202200210
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Multifunctional Dual Gated Coupling Device Using Van Der Waals Ferroelectric Heterostructure

Abstract: ultrasonic equipment and capacitors, [2] the Pb(Zr,Ti)O 3 systems are considered excellent piezoelectric material, [3,4] and the study of ferroelectricity in thin-film structures has been facilitated by the discovery of poly(vinylidene fluoridetrifluoroethylene). [5] In modern studies, ferroelectric materials are mainly applied in the development of ferroelectric non volatile memory (FeRAM), [6] negative capacitance field-effect transistors (NCFET), [7,8] and ferroelectric photodetectors [9] and biosensors. [1… Show more

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Cited by 9 publications
(3 citation statements)
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“…By employing a dual gate structure, bilayer with a ferroelectric dielectric, or heterostructure configuration, the memory characteristics can be enhanced. [38,44,45] The mechanism that enables the implementation of memory characteristics can be explained by the OOP polarization switching of the In 2 Se 3 layer induced by an external electrical field. When using a relatively thick SiN x /SiO 2 dielectric of 65/50 nm, partial polarization near the front channel of the In 2 Se 3 layer can be induced.…”
Section: Nonvolatile Memory Characteristics Of In 2 Se 3 Fes-fetmentioning
confidence: 99%
“…By employing a dual gate structure, bilayer with a ferroelectric dielectric, or heterostructure configuration, the memory characteristics can be enhanced. [38,44,45] The mechanism that enables the implementation of memory characteristics can be explained by the OOP polarization switching of the In 2 Se 3 layer induced by an external electrical field. When using a relatively thick SiN x /SiO 2 dielectric of 65/50 nm, partial polarization near the front channel of the In 2 Se 3 layer can be induced.…”
Section: Nonvolatile Memory Characteristics Of In 2 Se 3 Fes-fetmentioning
confidence: 99%
“…26,27 The reported solution is usually coupling of an hexagonal boron nitride (hBN) layer with the ferroelectric material. 28,29 However, this solution results in a large EOT (ca. 1.3 nm corresponding to a four-layer hBN flake).…”
Section: Introductionmentioning
confidence: 99%
“…The negative capacitance (NC) effect in ferroelectrics and antiferroelectrics is expected to reduce the power dissipation of transistors, [1][2][3][4] and promote the energy storage applications of supercapacitors. [5] In transistors, the NC effect can overcome the fundamental limit and reduce the subthreshold swing to lower than 60 mV dec −1 , [6][7][8][9] and realize ultra-thin ferroic gate stack in advanced transistors. [10] In supercapacitors, the NC effect can boost the energy storage density due to the capacitance enhancement, and enable the theoretical storage efficiency of 100% due to the hysteresis-free behavior between polarization and electric field.…”
Section: Introductionmentioning
confidence: 99%