Multipactor breakdown in microwave pulses

Rasch, Joel; Anderson, D.; Semenov, V. E.

doi:10.1088/0022-3727/46/50/505201

Cited by 13 publications

(7 citation statements)

References 12 publications

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“…Secondary electron emission from the material surface plays an essential role in multipactor, [1][2][3][4] which will seriously deteriorate the performances of spacecraft microwave components, [5][6][7] such as the fluctuation of cavity tuning, parameter coupling, waveguide loss, and phase constant, producing harmonics, leading to out-of-band interference and passive intermodulation products, and corroding the surface of components. [8][9][10][11] In recent years, since deep space exploration requires more miniaturization and high-power microwave components, the issue, i.e.…”

Section: Introductionmentioning

confidence: 99%

Characteristics of secondary electron emission from few layer graphene on silicon (111) surface

Feng¹,

Li²,

Li³

et al. 2022

Chinese Phys. B

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As a typical 2D coating material, graphene has been utilized to effectively reduce secondary electron emission from the surface. Nevertheless, the microscopic mechanism and the dominant factor of secondary electron emission suppression remain controversial. Since traditional models rely on experimental bulk properties data which is scarcely appropriate for the 2D coating situation, this paper presents a first-principles based numerical calculation of the electron interaction and emission process for monolayer and multilayer graphene on the silicon (111) substrate. By using the anisotropic energy loss for the coating graphene, the electron transport process can be described more realistically. The real physical electron interactions, including the elastic scattering of electron-nucleus, inelastic scattering of the electron-extranuclear electron and electron-phonon effect, are considered and calculated based on the Monte Carlo method. To be independent of experimental data, the energy level transition theory based first-principles method and the full Penn Algorithm are used to calculate the energy loss function during the inelastic scattering. Variations of the energy loss function and interface electron density difference for 1L to 4L layer graphene coating GoSi are calculated, and their inner electron distributions and secondary electron emission are analyzed. Simulation results demonstrate that the dominant factor of the SEY inhibition for GoSi is the mechanism by inducing electrons deeper during the internal scattering process. In contrast, a low surface potential barrier due to the positive deviation of electron density difference in monolayer GoSi interface inversely weakens the suppression of graphene layer on secondary electron emission. Only when the graphene layer number is 3L, the contribution of surface work function to the secondary electron emission suppression presents to be slightly positive.

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Section: Introductionmentioning

confidence: 99%

Characteristics of secondary electron emission from few layer graphene on silicon (111) surface

Feng¹,

Li²,

Li³

et al. 2022

Chinese Phys. B

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“…This detrimental effect is a self-sustained electron avalanche caused by the impingement of electrons against the metallic surface of microwave components accelerated by energy in an RF field. Multipactor discharge in space high-power microwave components may bring serious breakdown and insulation failure [1][2][3] which has inspired research on developing effective approaches to inhibit SEE [4][5][6]. Secondary electron yield (SEY) is frequently used as the index for describing SEE behavior and is defined as the proportion of secondary electron numbers to primary electron numbers.…”

Section: Introductionmentioning

confidence: 99%

Significantly Reduced Secondary-Electron-Yield of Aluminum Sheet with Fluorocarbon Coating

Wang

Zhao

et al. 2018

Coatings

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In this work, the surface of Al sheet was coated with a fluorocarbon (FC) thin film by radio frequency (RF) sputtering of polytetrafluoroethylene (PTFE) to investigate the influence of dielectric coatings on the secondary electron yield (SEY) behavior of Al sheets. Atomic-force microscopy (AFM) and energy-dispersive spectroscopy (EDS) were employed to identify the surface topographies and elemental contents of the samples with FC coatings. Water contact angle (WCA) measurements were performed to characterize the surface tension as well as the polar and dispersion components of the samples' surface. The secondary electron-mission (SEE) behavior of the samples was determined by measuring the SEY coefficients in an ultra-high vacuum chamber with three electron guns. The experimental results indicated that the longer sputtering time effectively led to the increase in coating thickness and a higher ratio of F/C, as well as the continued decrease of surface tension. A quite thin FC coating of about 11.3 nm on Al sheet resulted in the value of maximum SEY (δ max ) dropping from 3.02 to 1.85. The further increase in coating thickness beneficially decreased δ max down to 1.60, however, at the cost of a ten-fold thicker coating (ca. 113 nm). It is found that increasing the coating thickness contributes to reducing SEY coefficients as well as suppressing SEE. The results are expected to guide the design of dielectric-coating for SEY reduction as well as multipactor suppression on Al.2 of 12 of a sample surface can be tailored to create triangular, rectangular and micro-porous grooves through several approaches such as laser lithography and laser and chemical etching. Parts of the primary incident electrons are trapped in the grooved structures by changing its trajectory, thus restraining SEE [9][10][11][12]. On the premise of a large depth-to-width ratio and high aspect ratio, rough surfaces with irregular structures created by artificial means also work. The surface roughness is likely to act as a blackbody or rough surface cage. Particle bombardment is an emerging and promising method to prepare rough surfaces with reduced SEY. Yang et al. [13] found that argon ion sputtering reduced the SEY of gold by eliminating contamination but also the roughing surface induced ion bombardment. An "equivalent work-function" relating the effect of contamination and surface roughness was proposed to predict SEY. Furthermore, Hu et al. [14] analyzed the influence of bombardment intensity and ion energy on the SEY of copper plates. Based on different surface topographies fabricated by ion bombardment, the optimized ion-beam parameters to achieve the lowest SEY of copper were obtained. In association with the experimental construction of rough structures, numerical simulation and dynamic calculation have developed rapidly. Theoretical research has mainly focused on building up rough-structure models, which consider the energy and incident angle of primary electrons. Chang et al. [15] applied particle-in-cell simulation to analyze the chang...

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“…Understanding of the multipactor phenomenon when involving constant envelope RF pulses, seems to be the first step towards the comprehension of realistic signals, where the signal envelope varies with time within the pulse. According to the authors' knowledge, there are few studies concerning microwave pulse width effect in the multipactor discharge [3]- [5], but none of them present both theoretical and experimental results. In this manuscript, we analyze the multipactor behavior in constant envelope RF pulses from both a theoretical and experimental point of view.…”

Section: Introductionmentioning

confidence: 99%

Experimental Analysis of the Multipactor Effect With RF Pulsed Signals

Gonzalez-Iglesias

Belda²,

Díaz

et al. 2015

IEEE Electron Device Lett.

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Abstract-The main goal of this work is the analysis of the multipactor effect within a coaxial waveguide excited by an RF pulsed signal. The variation of the multipactor RF voltage threshold with the ON interval length of the pulse has been analyzed. To reach this aim, an in-house multipactor simulation code based on the Monte-Carlo algorithm has been implemented. Numerical simulations show that the multipactor RF voltage threshold increases as the ON pulse interval diminishes. In addition, an experiment was carried out to validate the proposed theoretical model, demonstrating the excellent agreement between theory and experimental data. Finally, the results are compared to the "20-gap-crossing" rule used in the space standard document (ECSS-E20-1A).

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Multipactor breakdown in microwave pulses

Cited by 13 publications

References 12 publications

Characteristics of secondary electron emission from few layer graphene on silicon (111) surface

Characteristics of secondary electron emission from few layer graphene on silicon (111) surface

Significantly Reduced Secondary-Electron-Yield of Aluminum Sheet with Fluorocarbon Coating

Experimental Analysis of the Multipactor Effect With RF Pulsed Signals

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