MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

Silva, Tiago Fiorini da; Rodrigues, C. L.; Mayer, M.; Moro, Marcos V.; Trindade, Gustavo F.; Aguirre, Fernando; Added, N.; Rizzutto, M. A.; Tabacniks, M.H.

doi:10.1016/j.nimb.2015.10.038

Cited by 76 publications

(39 citation statements)

References 14 publications

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“… layer composition,  energy resolution, detector active thickness common to all spectra, we used, as complementary software tool, MULTISIMNRA [40] to fit S spectra with NS channels of the same sample. The quantity:…”

Section: Chemical Analysis By Iga and Ibamentioning

confidence: 99%

Novel insight into the chemical analysis of light elements in oxycarbides

et al. 2018

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Pure powders of TiCxO(1-x) solid solution were synthesized through the carbothermal route. The chemical analysis of the light elements in the as-obtained TiCxO(1-x) oxycarbides powders were performed by Instrumented Gas Analysis (IGA). The cell parameters of the samples were determined with an accuracy of about 2% by means of X-ray powder diffraction and the internal standard method. As a result, a model correlating the cell parameters to the chemical composition was established. These reference TiCxO(1-x) oxycarbides powders were then sintered in order to obtain pellets of dense ceramics. After having determined that the sintering process does not change the chemical composition of the starting powder, chemical analysis of the different samples of the solid solution were successfully undertaken by Ion Beam Analysis techniques (IBA). The Nuclear Reaction Analysis (NRA) method -that was used to analyse light elements with very high sensitivity -was coupled with Rutherford Back Scattering (RBS) analysis in order to accurately determine the metallic over light elements ratio and to determine the stoichiometry of the phase on massive samples. Exhaustive simulations of the NRA spectra were performed and demonstrated that discrete compositions of the TiCxO(1-x) can be efficiently measured locally for bulk samples. Compared to IGA results, the relative amounts of carbon and oxygen of bulk materials were determined with a bias lower than 5%. This protocol being implemented for the TiCxO(1-x) system was then tested on HfCxO(1-x)with the same success.3

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Section: Chemical Analysis By Iga and Ibamentioning

confidence: 99%

Novel insight into the chemical analysis of light elements in oxycarbides

et al. 2018

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“…For the EBS modeling, the cross-section for the 16 O(p,p) 16 O elastic scattering provided by SigmaCalc was used [16]. The set of spectra was processed selfconsistently [17,18], which means that all spectra were fitted simultaneously by the minimization of a χ 2 function that takes into account all spectra. The sample model that best describes all available data (minimum χ 2 ) is elected to represent the sample.…”

Section: Boron Deposition and Ion Beam Analysismentioning

confidence: 99%

“…For a deeper description of the self-consistent approach, see Ref. [18]. Figure 6 presents the sample depth profile of elements, where the depth referred to the sample surface is expressed in 10 15 at/cm 2 units.…”

Section: Boron Deposition and Ion Beam Analysismentioning

confidence: 99%

“…Figure 6 presents the sample depth profile of elements, where the depth referred to the sample surface is expressed in 10 15 at/cm 2 units. This model for the sample was obtained using the MultiSIMNRA software [18,19], and the thickness of the lines represents the uncertainty obtained by a Monte-Carlo calculation to explore solutions with statistical significance on variations of the objective function. It is possible to observe a low-concentration of oxygen in the film, and a higher-concentration in the interface between the boron film and the copper substrate, suggesting the oxidation of the substrate surface prior the boron deposition.…”

Section: Boron Deposition and Ion Beam Analysismentioning

confidence: 99%

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Characterization of multilayer Thick-GEM geometries as ¹⁰B converters aiming thermal neutron detection

et al. 2018

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Abstract. Boron-based thermal neutron detectors have recently regained some attention from the instrumentation community as a strong alternative to helium-3 detectors. From the existing concepts exploiting boron layers in position sensitive detectors, the Cascade [1] is the one that takes full advantage of the 2D capabilities of gaseous detectors, with the position resolution not limited by the architecture of the detector. In this work, a proposal for the Cascade detector, based on Thick-GEMs is presented, together with some preliminary studies of the suitable pitch that optimizes the neutron conversion efficiency, while keeping the collection efficiency intact. The characterization of Thick-GEM prototypes produced in Brazil with hole pitch from 0.75 to 3 mm shows that these devices already present a stable performance at low gains, also resulting in fair energy resolution, when cascaded with a standard Kapton TM 50 µm GEM. Results of the first attempts of boron film depositions with Ion Beam Assisted Deposition and characterization by Ion Beam Analysis are also presented.

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“…Depth profiles were derived from the spectra using MultiSIMNRA [21] assuming atomic mixing of all elements. The same input parameters (stopping powers, cross-sections, particles times steradians etc.)…”

Section: Simulation Of Spectramentioning

confidence: 99%

Computer simulation of backscattering spectra from paint

Mayer

Silva

2017

Nuclear Instruments and Methods in Physics Research Section B:

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To study the role of lateral non-homogeneity on backscattering analysis of paintings, a simplified model of paint consisting of randomly distributed spherical pigment particles embedded in oil/binder has been developed. Backscattering spectra for lead white pigment particles in linseed oil have been calculated for 3 MeV H + at a scattering angle of 165° for pigment volume concentrations ranging from 30 vol.% to 70 vol.% using the program STRUCTNRA. For identical pigment volume concentrations the heights and shapes of the backscattering spectra depend on the diameter of the pigment particles: This is a structural ambiguity for identical mean atomic concentrations but different lateral arrangement of materials. Only for very small pigment particles the resulting spectra are close to spectra calculated supposing atomic mixing and assuming identical concentrations of all elements.Generally, a good fit can be achieved when evaluating spectra from structured materials assuming atomic mixing of all elements and laterally homogeneous depth distributions.However, the derived depth profiles are inaccurate by a factor of up to 3. The depth range affected by this structural ambiguity ranges from the surface to a depth of roughly 0.5 to 1 pigment particle diameters. Accurate quantitative evaluation of backscattering spectra from paintings therefore requires taking the correct microstructure of the paint layer into account.

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MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

Cited by 76 publications

References 14 publications

Novel insight into the chemical analysis of light elements in oxycarbides

Novel insight into the chemical analysis of light elements in oxycarbides

Characterization of multilayer Thick-GEM geometries as ¹⁰B converters aiming thermal neutron detection

Computer simulation of backscattering spectra from paint

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MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

Cited by 76 publications

References 14 publications

Novel insight into the chemical analysis of light elements in oxycarbides

Novel insight into the chemical analysis of light elements in oxycarbides

Characterization of multilayer Thick-GEM geometries as 10B converters aiming thermal neutron detection

Computer simulation of backscattering spectra from paint

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Product

Resources

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Characterization of multilayer Thick-GEM geometries as ¹⁰B converters aiming thermal neutron detection