“…On the other hand, the PGAA and NAA techniques are bulk measurements and not depth-sensitive, and the sensitivity is strongly isotope dependent. The technique of Muon-Induced X-ray Emission (MIXE), a non-destructive technique, which was developed more than 40 years ago [14,15,16,17], has recently been used extensively with pulsed muon beams for elemental analysis [18,19,20,21,22,23,24,25,26,27,28,29,30,31]. The advantage of this technique is that it is able to probe deep into the material, up to a few millimeters, and does not lead to a severe radiation damage of the sample.…”