2018
DOI: 10.1007/s10967-018-5746-z
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Muonic X-ray measurements on mixtures of CaO/MgO and Fe3O4/MnO

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Cited by 6 publications
(6 citation statements)
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“…The irradiation time of each sample was approximately 5 h. Three high-purity-germanium semiconductor detectors: GL0110 (CANBERRA), GLP 36360 (ORTEC), and GMX20P4 (ORTEC) were set around the vacuum chamber covering different energy ranges of 0-250 keV, 0-500 keV, and 0-4000 keV, respectively. The detailed experimental setup is shown in our previous papers [8,9]. Figure 1 shows the energy spectrum of the GLP36360 detector for the muon irradiation of the K 3 [Fe(CN) 6 ] sample.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The irradiation time of each sample was approximately 5 h. Three high-purity-germanium semiconductor detectors: GL0110 (CANBERRA), GLP 36360 (ORTEC), and GMX20P4 (ORTEC) were set around the vacuum chamber covering different energy ranges of 0-250 keV, 0-500 keV, and 0-4000 keV, respectively. The detailed experimental setup is shown in our previous papers [8,9]. Figure 1 shows the energy spectrum of the GLP36360 detector for the muon irradiation of the K 3 [Fe(CN) 6 ] sample.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…[15][16][17] used Muon Induced X-ray Emission (MIXE), while the Ref. [18] used Muonic Atom X-ray Spectroscopy (MAXRS); all of which describe the same technique), a non-destructive technique, which was developed more than 40 years ago [14,[19][20][21], has recently been used extensively with pulsed muon beams for elemental analysis [16,18,[22][23][24][25][26][27][28][29][30][31][32][33][34]. The advantage of this technique is that it is able to probe deep into the material, up to a few millimeters, and does not lead to a severe radiation damage of the sample.…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, the PGAA and NAA techniques are bulk measurements and not depth-sensitive, and the sensitivity is strongly isotope dependent. The technique of Muon-Induced X-ray Emission (MIXE), a non-destructive technique, which was developed more than 40 years ago [14,15,16,17], has recently been used extensively with pulsed muon beams for elemental analysis [18,19,20,21,22,23,24,25,26,27,28,29,30,31]. The advantage of this technique is that it is able to probe deep into the material, up to a few millimeters, and does not lead to a severe radiation damage of the sample.…”
Section: Introductionmentioning
confidence: 99%