Mutimodal Artifact Metrics and its Applicability Experiments

Abstract

In this paper, we propose multimodal artifact metrics. We came up with this idea based on multimodal identification metrics in biometrics and is expected to verify the artifact's authenticity with high accuracy by using more than two characteristic information with different physical characteristics extracted from the artifact. In this technique, counterfeiting of copied products seems to be more difficult even for the manufacturers who are producing the genuine products. In order to explore the feasibility of this idea, we present the results of two experiments: One is making samples made of conductive polymer and filler with optical characteristic. Another one is extracting two types of characteristic information from each sample. Extracted information (resistance and IR image) were different for each specimen, as we estimated.