Abstract-This study focuses on multimodal artifact metrics and proposes a technique based on multimodal biometric systems that are a type of biometric identification systems. It is expected that this technique can aid in verifying the authenticity of each artifact in a more accurate manner and in increasing the level of difficulty involved in counterfeiting when compared to those of existing artifact metric techniques. This technique will ensure that artifacts will possess specific characteristics (two or more) that are extracted from different physical characteristics. The study created card-shaped samples with two physical characteristics (electrical and optical characteristics) to prove the feasibility of the proposed technique. The results indicate that two information features, namely sheet resistance and visible light image, which are extracted from the above characteristics, are different in each sample. This indicates that the two information features can correspond to the characteristic information necessary to distinguish each sample.

In this paper, we propose multimodal artifact metrics. We came up with this idea based on multimodal identification metrics in biometrics and is expected to verify the artifact's authenticity with high accuracy by using more than two characteristic information with different physical characteristics extracted from the artifact. In this technique, counterfeiting of copied products seems to be more difficult even for the manufacturers who are producing the genuine products. In order to explore the feasibility of this idea, we present the results of two experiments: One is making samples made of conductive polymer and filler with optical characteristic. Another one is extracting two types of characteristic information from each sample. Extracted information (resistance and IR image) were different for each specimen, as we estimated.

In this paper, we propose multimodal artifact metrics, which are based on multimodal identification metrics in biometrics. These metrics should verify an artifact's authenticity with high accuracy using more than two characteristic types of information with different physical characteristics that are extracted from the artifact. In this technique, the counterfeiting of copied products is more difficult, even for the manufacturers who are producing the genuine products. In order to explore the feasibility of this idea, we present the results of two experiments: One is the creation of samples made of conductive polymer and filler with optical characteristics. The other one extracts two types of characteristic information from each sample. The extracted information (resistance and IR image) was different for each specimen, as we anticipated.Index Terms-Artifact metrics, characteristic information, multimodal, verification of authenticity.