Multiple building components with
a variety of switching capabilities
are required to implement memory-driven parallel computing architecture
and multifunctional device applications. In this regard, there is
a high demand for implementing multiple switching modes based on only
one active material in a simple device form. In this study, we demonstrated
the ability of a solution-processable two-terminal Ag (or Al)/NiO
x
/ITO memristor that exhibits triple-switching
characteristics depending on the different voltage regimes. Notably,
the device exhibits an analog bipolar switching behavior under a low
programming voltage (≤1.0 V), enabling essential synaptic functions,
as well as a high recognition accuracy of 87.42% in a single-layer
neural network. After the electroforming process to form the oxygen
vacancy-based conductive filament in the NiO
x
layer, the device concurrently exhibited digital bipolar switching
and unipolar threshold switching behaviors at different voltage regimes
without compliance current. These three switching characteristics
are related to the transition of dominant switching mechanisms depending
on the operating scheme, which is investigated using various material
and chemical characterization techniques during switching, including
cross-sectional scanning transmission electron microscopy, atomic
force microscopy, ultraviolet photoelectron spectroscopy, and X-ray
photoelectron spectroscopy.