Thermal hysteresises of electrical resistance, accompanying with a structural phase transition, in epitaxial VO 2 films have been successfully reduced to 1°C or less by doping Ti or Nb ions. We considered that owing to the metal-ion-substitutive structural defects induced by doping metal ions into VO 2 films, the structural phase transition easily occurred without superheating or supercooling. In Nb-doped VO 2 films, the hysteresis disappeared at a lower doping level than Ti-doped VO 2 films. The maximum values of the temperature coefficient of the resistance of V 0.91 Ti 0.09 O 2 and V 0.982 Nb 0.018 O 2 films, which exhibited non-hysteretic MI transitions, were ¹24.8%/°C at 46°C and ¹21.6%/°C at 19°C, respectively.