Reported are fabrication and characterisation of a novel vacuum logic OR gate using two identical nanodiamond lateral field emission diodes fabricated on silicon-on-insulator wafers. Each diode consists of 9000 finger-like emitters with 4 mm interelectrode spacing. High and stable emission current with low turn-on field have been observed and verified by a Fowler-Nordheim plot for each structure. Diode-resistor logic is used to realise the logic OR function. This nanodiamond vacuum logic gate is very promising for application in harsh environments.Introduction: Lateral vacuum field emission devices offer several fabrication and structural advantages over vertical structures [1]. Materials other than nanodiamond for lateral emitters have been reported before, but practical application was not possible because of their poor field emission property [1][2][3][4]. Chemical vapour-deposited (CVD) diamond, because of its excellent electrical, mechanical and chemical properties, provides an excellent material choice to fabricate cold cathode field emission devices [5]. Vacuum logic gates, other than using nanodiamond lateral emitters, have been proposed and simulated before [6, 7], but practical application was not possible because of design complexity and high turn-on field. Previously, we have reported fabrication and characterisation of nanodiamond lateral devices in different configurations with no measurable changes in device structure and electrical behaviour after exposure to high neutron fluence, high dose of X-ray and elevated temperature, signifying an emerging electronics for harsh environment [8 -11]. In this Letter, realisation of a nanodiamond lateral field emission diode based vacuum logic OR gate using dioderesistor logic is presented for the first time.