Scattering luminescent materials dispersed in liquid
and solid
matrices and luminescent powders are increasingly relevant for fundamental
research and industry. Examples are luminescent nano- and microparticles
and phosphors of different compositions in various matrices or incorporated
into ceramics with applications in energy conversion, solid-state
lighting, medical diagnostics, and security barcoding. The key parameter
to characterize the performance of these materials is the photoluminescence/fluorescence
quantum yield (Φf), i.e., the number of emitted photons
per number of absorbed photons. To identify and quantify the sources
of uncertainty of absolute measurements of Φf of
scattering samples, the first interlaboratory comparison (ILC) of
three laboratories from academia and industry was performed by following
identical measurement protocols. Thereby, two types of commercial
stand-alone integrating sphere setups with different illumination
and detection geometries were utilized for measuring the Φf of transparent and scattering dye solutions and solid phosphors,
namely, YAG:Ce optoceramics of varying surface roughness, used as
converter materials for blue light emitting diodes. Special emphasis
was dedicated to the influence of the measurement geometry, the optical
properties of the blank utilized to determine the number of photons
of the incident excitation light absorbed by the sample, and the sample-specific
surface roughness. While the Φf values of the liquid
samples matched between instruments, Φf measurements
of the optoceramics with different blanks revealed substantial differences.
The ILC results underline the importance of the measurement geometry,
sample position, and blank for reliable Φf data of
scattering the YAG:Ce optoceramics, with the blank’s optical
properties accounting for uncertainties exceeding 20%.