2016
DOI: 10.1088/0957-4484/27/29/295302
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Nanofabrication of arrays of silicon field emitters with vertical silicon nanowire current limiters and self-aligned gates

Abstract: We developed a fabrication process for embedding a dense array (10(8) cm(-2)) of high-aspect-ratio silicon nanowires (200 nm diameter and 10 μm tall) in a dielectric matrix and then structured/exposed the tips of the nanowires to form self-aligned gate field emitter arrays using chemical mechanical polishing (CMP). Using this structure, we demonstrated a high current density (100 A cm(-2)), uniform, and long lifetime (>100 h) silicon field emitter array architecture in which the current emitted by each tip is … Show more

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Cited by 110 publications
(65 citation statements)
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“…It can be seen from the I collect − V driven curve that, I collect becomes measurable when the V driven is larger than ≈3.1 V. It then increases exponentially with V driven and approaches ≈20 µA at V driven = 3.9 V. Taking the horizontally projected area of emitting SACNT films (S = 1500 µm 2 ) into consideration, an emission current density up to ≈1.33 A cm −2 is obtained, which is comparable to that of commercial thermionic electron emitters. [19,20] The driven voltage as a function of emission current density from the device measured in Figure 2b together with those of previously reported gated FEAs [21][22][23][24][25][26] are plotted on the same graph in Figure 2c. Here, driven voltage of FEAs refers to the voltage applied to the gate electrode.…”
Section: Thermionic Electron Emission Characteristics Of Single Micromentioning
confidence: 90%
“…It can be seen from the I collect − V driven curve that, I collect becomes measurable when the V driven is larger than ≈3.1 V. It then increases exponentially with V driven and approaches ≈20 µA at V driven = 3.9 V. Taking the horizontally projected area of emitting SACNT films (S = 1500 µm 2 ) into consideration, an emission current density up to ≈1.33 A cm −2 is obtained, which is comparable to that of commercial thermionic electron emitters. [19,20] The driven voltage as a function of emission current density from the device measured in Figure 2b together with those of previously reported gated FEAs [21][22][23][24][25][26] are plotted on the same graph in Figure 2c. Here, driven voltage of FEAs refers to the voltage applied to the gate electrode.…”
Section: Thermionic Electron Emission Characteristics Of Single Micromentioning
confidence: 90%
“…In that context, extensive research is ongoing for field emission arrays (FEAs) and gated‐field emission arrays to modulate the emission current. Few latest significant studies are silicon‐based FEA, diamond‐based FEA, ZnO‐based FEA, and CNT‐based FEA …”
Section: Utilization (Applications)mentioning
confidence: 99%
“…This demonstration triode was not optimized for low turn‐on potential or high transconductance. Transconductance values as high as 30 µS are obtainable from optimized silicon field emitter arrays with integrated gates, of 30 µS from a 500 × 500 tip array, in part by reducing the gate‐cathode tip distance to less than 1 micron . Future work on inverse opal field emitters could take advantage of the uniformity and mechanical stability of the emitter array to fabricate integrated gate and anode layers with much smaller distances.…”
Section: Triode Performance Results and Discussionmentioning
confidence: 99%