and various substrates is essential for graphene-based nanomechanical and nanoelectric devices. [12,13] In recent years, a large number of experimental studies of measuring interfacial adhesion energies between mechanically exfoliated graphene or chemically vapor deposited (CVD) graphene and support substrates have been reported by using the pressurized blister test with intercalated nanoparticles, [14] inflated air, [15,16] and deionized water, [17] double cantilever beam fracture mechanics test, [18] pleat defect measurement, [19] atomic force microscope (AFM) nanoindentation, [20][21][22] and optical fiber Fabry-Perot interference. [23] Although the discrepancy exists in the measurement results due to the nonuniformity of fabricated graphene membranes and principle errors of various measurement methods, these experimental studies have significantly advanced the understanding of graphene adhesion behaviors. Unfortunately, such approaches to determine the adhesion energy of graphene and a substrate typically involve specific measurement setups and professional sample fabrication or test procedures, as well as relatively complicated analytical models for adhesion energies. Even if for the AFM nanoindentation method recently utilized more, the extremely thin sheet is hard to handle and prone to damage by clamps and fixtures as in the conventional peel test, [14] and the effect of surface roughness of the spherical tip of AFM should be addressed by the modified Rumpf model. [21] Moreover, the disturbance of the pull-off instability generally occurs during the tip-sample interaction. [24] For this reason, a simple, general, and direct measurement of adhesion energy for graphene membranes on a variety of substrates is highly necessary.In this paper, we demonstrated an improved nanoscale quantification study of adhesion energy of CVD graphene membranes with different layer thicknesses on SiO 2 substrate, by directly measuring the size (diameter and height) of graphene bubbles covered with single and dual gold nanoparticles showing regular circular or elliptical geometries, respectively. This presented method differs from the aforementioned ref. [14] in which only isolated single particles with regular circular blister geometries are available. This resulting disadvantage is that the sample fabrication process is possibly repeated many times to achieve satisfactory results by locating those tiny regular single nanoparticles via scanning electron microscope (SEM). However, regular blister geometries formed by two particles can also contribute to the solution of interfacial adhesion energy of graphene on substrates. Hence, to extend the applicability and robustness of this presented method, a generalized van der Waals adhesion behavior at the interface between graphene and support substrates is important to characterize the performance of graphenebased sensors. Here an improved, general, and direct method of determining the adhesion energies of monolayer/few-layer/multilayer graphene sheets on silicon wafers is demonstra...