Nanolayer Analysis by Neutron Reflectometry

Neutron reflectometry to measure in situ the rate determining step of lithium ion transport through thin silicon layers and interfaces

“…During NR experiments, a neutron beam strikes the sample surface under a small angle (y), is reflected at each isotope or composition interface and is afterwards detected. Due to the interference of the individual partial beams a characteristic interference pattern 36 is formed (e.g., a Bragg reflection or Bragg peak, Fig. 1).…”

“…NR permits the detection of buried interfaces deep within complex sample environments in a non-destructive manner and allows the study of in-operando processes in LIBs during device operation. [30][31][32][33][34][35][36][37][38] This work describes the use of neutron reflectometry to measure the transport of Li across Si layers in a multilayer. It is the latest in a series of related articles 26,29,35,[39][40][41] of increasing sophistication and quality of information.…”

Metal (boro-) hydrides for high energy density storage and relevant emerging technologies

“…Neutron reflectometry is a non-destructive experimental method that utilizes the way neutrons are reflected by sufficiently large (> 100 mm 2 ) and flat surfaces to obtain structural information about the composition, roughness and thickness of thin films and other layered samples with layer thicknesses of 3 -200 nm and with sub-nanometre resolution [414,415]. In a neutron reflectometry experiment, the sample is illuminated by a neutron beam under a small angle (θ < 5°).…”

Self-Assembly of Magnetic Nanoparticles in Ferrofluids on Different Templates Investigated by Neutron Reflectometry

“…To determine the depth dependence of the nuclear and magnetic SLD profiles, the reflectivity data are fit to a slab model for the SLDs based upon the Parratt formalism [ 54 ], which is implemented, for example, in the Refl1D software package [ 55 , 56 ] using the super-iterative algorithm [ 57 ]. In general, the nuclear SLD profile represents the depth-dependent composition of the sample averaged across the sample plane.…”