Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope

Abstract

Modern methods of in situ transmission electron microscopy (TEM) allow one to not only manipulate with a nanoscale object at the nanometer-range precision but also to get deep insights into its physical and chemical statuses. Dedicated TEM holders combining the capabilities of a conventional high-resolution TEM instrument and atomic force -, and/or scanning tunneling microscopy probes become the powerful tools in nanomaterials analysis. This progress report highlights the past, present and future of these exciting methods based on the extensive authors endeavors over the last five years. The objects of interest are diverse. They include carbon, boron nitride and other inorganic one- and two-dimensional nanoscale materials, e.g., nanotubes, nanowires and nanosheets. The key point of all experiments discussed is that the mechanical and electrical transport data are acquired on an individual nanostructure level under ultimately high spatial, temporal and energy resolution achievable in TEM, and thus can directly be linked to morphological, structural and chemical peculiarities of a given nanomaterial.

Nanomechanical cleavage of molybdenum disulphide atomic layers

“…In this work, we design an in situ transmission electron microscopy (TEM) probing technique [17][18][19][20] to investigate the initial stages of the 2D crystal cleavage, which is defined here as the 'nanomechanical cleavage', using MoS 2 atomic layers as a model material. By precisely manipulating an ultra-sharp metal probe to contact the pre-existing crystalline steps of the MoS 2 single crystals, atomically thin flakes are delicately peeled off, selectively ranging from a single, double to more than 20 atomic layers.…”

Surface-induced structural transformation in nanowires

“…In particular, sensors and actuators based on microelectromechanical systems (MEMS) make in situ quantitative TEM investigation of the deformation mechanisms of nanowires [103][104][105][106][107][108][109][110][111] and sub-micron pillars [112][113][114] possible. However, the work is still challenging for nanowires because of the intricate nature of specimen fabrication and manipulation.…”

Dynamic In‐Situ Experimentation on Nanomaterials at the Atomic Scale

“…To overcome this problem, a mechanical quantity sensor is integrated into the tip of the holder. By using this method, in situ tensile tests have been performed on CNTs, BN nanotubes, WS 2 nanotubes, and other 1D or 2D nanostructures . In situ nanoindentation tests can also be performed inside the TEM using a similar holder .…”