2007
DOI: 10.1103/physrevb.76.235301
|View full text |Cite
|
Sign up to set email alerts
|

Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

2
28
0

Year Published

2008
2008
2014
2014

Publication Types

Select...
4
3
2

Relationship

0
9

Authors

Journals

citations
Cited by 40 publications
(30 citation statements)
references
References 86 publications
2
28
0
Order By: Relevance
“…It is known that FIB milled holes are favored nucleation centers, 9,18 and an arrangement of dots similar to the underlying holes pattern is thus expected on patterned regions upon annealing. Nevertheless, in nonpatterned regions some degree of order is expected as well, as a consequence of the nucleation mechanism itself.…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…It is known that FIB milled holes are favored nucleation centers, 9,18 and an arrangement of dots similar to the underlying holes pattern is thus expected on patterned regions upon annealing. Nevertheless, in nonpatterned regions some degree of order is expected as well, as a consequence of the nucleation mechanism itself.…”
mentioning
confidence: 99%
“…In our case, where ⌬ / L Ϸ 0.3, we attribute deviations from the ideal case to the finite size of the dots and to the fact that their nucleation center is located either inside or beside the hole, depending on local nanotopography. 17,18 To prove this hypothesis, we model the experimental PDF using a twodimensional square lattice of points with a = 50 nm, much like the holes pattern prepared with FIB. To account for the finite dots size and uncertainty on nucleation site, we position a single dot at random in a 30 nm diameter circle centered on each lattice point.…”
mentioning
confidence: 99%
“…The ion beam diameter is of order 50 nm. Atomically clean, electron transparent Si(100) samples are prepared using procedures previously described [6]. Growth of Ge QDs from digermane on unpatterned Si surfaces was performed at temperatures in the range 500-600 o C and typical digermane partial pressures ~ 10 -7 Torr.…”
Section: Methodsmentioning
confidence: 99%
“…Thus a great challenge regarding the integration of QDs into devices like single photon sources [2][3][4] , semiconductor building blocks for information processing [5][6][7][8] or electron memory modules 9,10 is the precise control of the position of the QDs. Recently several groups succeeded in the growth of site-controlled QDs and their integration into microcavities [11][12][13][14][15][16][17] , but a complete characterization of the intrinsic parameters of these dots is still missing.…”
Section: Introductionmentioning
confidence: 99%